dc.creatorBortoleto, JRR
dc.creatorGutierrez, HR
dc.creatorCotta, MA
dc.creatorBettini, J
dc.date2005
dc.date38169
dc.date2014-11-19T20:22:45Z
dc.date2015-11-26T17:08:41Z
dc.date2014-11-19T20:22:45Z
dc.date2015-11-26T17:08:41Z
dc.date.accessioned2018-03-28T23:57:19Z
dc.date.available2018-03-28T23:57:19Z
dc.identifierApplied Physics Letters. Amer Inst Physics, v. 87, n. 1, 2005.
dc.identifier0003-6951
dc.identifierWOS:000230277900043
dc.identifier10.1063/1.1953875
dc.identifierhttp://www.repositorio.unicamp.br/jspui/handle/REPOSIP/53516
dc.identifierhttp://www.repositorio.unicamp.br/handle/REPOSIP/53516
dc.identifierhttp://repositorio.unicamp.br/jspui/handle/REPOSIP/53516
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1280430
dc.descriptionThe mechanisms leading to the spontaneous formation of a two-dimensional array of InP/InGaP dots grown by chemical-beam epitaxy are discussed. Samples where the InGaP buffer layer was grown at different conditions were characterized by transmission electron microscopy. Our results indicate that a periodic strain field related to lateral two-dimensional compositional modulation in the InGaP buffer layer determines the dot nucleation positions during InP growth. Although the periodic strain field in the InGaP is large enough to align the InP dots, both their shape and optical properties are effectively unaltered. This result shows that compositional modulation can be used as a tool for in situ dot positioning. (c) 2005 American Institute of Physics.
dc.description87
dc.description1
dc.languageen
dc.publisherAmer Inst Physics
dc.publisherMelville
dc.publisherEUA
dc.relationApplied Physics Letters
dc.relationAppl. Phys. Lett.
dc.rightsaberto
dc.sourceWeb of Science
dc.subjectSemiconductor Alloys
dc.subjectStrained Ingaas
dc.subjectQuantum Dots
dc.subjectFilm Growth
dc.subjectNanostructures
dc.subjectSurfaces
dc.titleMechanism of lateral ordering of InP dots grown on InGaP layers
dc.typeArtículos de revistas


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