Artículos de revistas
STRAIN-MEASUREMENTS IN INXGA1-XAS GAAS STRAINED-LAYER SUPERLATTICES BY PHOTOMODULATED REFLECTANCE
Registro en:
Superlattices And Microstructures. Academic Press Ltd, v. 13, n. 2, n. 189, n. 192, 1993.
0749-6036
WOS:A1993LA09500011
10.1006/spmi.1993.1036
Autor
LEMOS, V
VAZQUEZLOPEZ, C
CERDEIRA, F
Institución
Resumen
13 2 189 192