dc.creator | DIAS, JAS | |
dc.creator | DEMORAES, WB | |
dc.date | 1992 | |
dc.date | DEC 3 | |
dc.date | 2014-12-16T11:33:25Z | |
dc.date | 2015-11-26T16:58:41Z | |
dc.date | 2014-12-16T11:33:25Z | |
dc.date | 2015-11-26T16:58:41Z | |
dc.date.accessioned | 2018-03-28T23:46:19Z | |
dc.date.available | 2018-03-28T23:46:19Z | |
dc.identifier | Electronics Letters. Iee-inst Elec Eng, v. 28, n. 25, n. 2350, n. 2351, 1992. | |
dc.identifier | 0013-5194 | |
dc.identifier | WOS:A1992KD32500058 | |
dc.identifier | http://www.repositorio.unicamp.br/jspui/handle/REPOSIP/78739 | |
dc.identifier | http://www.repositorio.unicamp.br/handle/REPOSIP/78739 | |
dc.identifier | http://repositorio.unicamp.br/jspui/handle/REPOSIP/78739 | |
dc.identifier.uri | http://repositorioslatinoamericanos.uchile.cl/handle/2250/1277991 | |
dc.description | A simple technique which employs a bias current with a positive nonlinear temperature coefficient is used to compensate for the temperature variations of the transconductance in a CMOS linearised differential pair. Simulated results show that a temperature drift of less than 100 ppm/degrees-C can be obtained in the 0-100-degrees-C range. | |
dc.description | 28 | |
dc.description | 25 | |
dc.description | 2350 | |
dc.description | 2351 | |
dc.language | en | |
dc.publisher | Iee-inst Elec Eng | |
dc.publisher | Hertford | |
dc.publisher | Inglaterra | |
dc.relation | Electronics Letters | |
dc.relation | Electron. Lett. | |
dc.rights | fechado | |
dc.source | Web of Science | |
dc.subject | TRANSCONDUCTORS | |
dc.subject | INTEGRATED CIRCUITS | |
dc.subject | Mos | |
dc.title | CMOS TEMPERATURE-STABLE LINEARIZED DIFFERENTIAL PAIR | |
dc.type | Artículos de revistas | |