Single- and few-walled carbon nanotubes grown at temperatures as low as 450 degrees C: Electrical and field emission characterization

dc.creatorGohier, A
dc.creatorDjouadi, MA
dc.creatorDubosc, M
dc.creatorGranier, A
dc.creatorMinea, TM
dc.creatorSirghi, L
dc.creatorRossi, F
dc.creatorParedez, P
dc.creatorAlvarez, F
dc.date2007
dc.dateSEP
dc.date2014-07-30T19:57:54Z
dc.date2015-11-26T16:57:05Z
dc.date2014-07-30T19:57:54Z
dc.date2015-11-26T16:57:05Z
dc.date.accessioned2018-03-28T23:44:36Z
dc.date.available2018-03-28T23:44:36Z
dc.identifierJournal Of Nanoscience And Nanotechnology. Amer Scientific Publishers, v. 7, n. 9, n. 3350, n. 3353, 2007.
dc.identifier1533-4880
dc.identifierWOS:000250388400050
dc.identifier10.1166/jnn.2007.883
dc.identifierhttp://www.repositorio.unicamp.br/jspui/handle/REPOSIP/74249
dc.identifierhttp://repositorio.unicamp.br/jspui/handle/REPOSIP/74249
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1277565
dc.descriptionSingle-wall (SW-) and few-walled (FW-) carbon nanotubes (CNTs) were synthesized on aluminum/cobalt coated silicon at temperatures as low as 450 degrees C by plasma enhanced chemical vapor deposition technique (PECVD). The SWCNTs and FWCNTs grow vertically oriented and well separated from each other. The cold field emission studies of as-grown SWCNTs and FWCNTs showed low turn-on field emission threshold voltages, strongly dependent of the nanotubes morphology. Current-voltage curves of individual CNTs, measured by conductive atomic force microscopy (CAFM), showed an electrical resistance of about 90 K Omega, that is attributed mainly to the resistance of the contact between the CNTs and the conductive CAFM tip (Au and Pt).
dc.description7
dc.description9
dc.description3350
dc.description3353
dc.languageen
dc.publisherAmer Scientific Publishers
dc.publisherStevenson Ranch
dc.publisherEUA
dc.relationJournal Of Nanoscience And Nanotechnology
dc.relationJ. Nanosci. Nanotechnol.
dc.rightsfechado
dc.sourceWeb of Science
dc.subjectfew-walled carbon nanotubes
dc.subjectsingle-walled carbon nanotubes
dc.subjectPECVD
dc.subjectlow temperature
dc.subjectfield emission
dc.subjectconductive atomic force microscopy
dc.subjectChemical-vapor-deposition
dc.subjectRoom-temperature
dc.subjectCatalyst
dc.titleSingle- and few-walled carbon nanotubes grown at temperatures as low as 450 degrees C: Electrical and field emission characterization
dc.typeArtículos de revistas


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