dc.creatorZanatta, AR
dc.creatorChambouleyron, I
dc.date1996
dc.dateFEB 15
dc.date2014-12-16T11:32:44Z
dc.date2015-11-26T16:56:23Z
dc.date2014-12-16T11:32:44Z
dc.date2015-11-26T16:56:23Z
dc.date.accessioned2018-03-28T23:43:48Z
dc.date.available2018-03-28T23:43:48Z
dc.identifierPhysical Review B. American Physical Soc, v. 53, n. 7, n. 3833, n. 3836, 1996.
dc.identifier0163-1829
dc.identifierWOS:A1996TW98100028
dc.identifier10.1103/PhysRevB.53.3833
dc.identifierhttp://www.repositorio.unicamp.br/jspui/handle/REPOSIP/54030
dc.identifierhttp://www.repositorio.unicamp.br/handle/REPOSIP/54030
dc.identifierhttp://repositorio.unicamp.br/jspui/handle/REPOSIP/54030
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1277360
dc.descriptionIn this work the relationship between the characteristic energy of the Urbach edge E(0) and the parameter B-1/2 of the Tauc's representation of the absorption coefficient of a-SiN- and a-GeN-based alloys is presented and discussed. No correspondence has been experimentally found between B-1/2 and the topological disorder induced by small impurity concentrations in the network (less than a few at. %), which provokes a broadening of the Urbach tail. In the alloy regime, nevertheless, E(0) and B-1/2 present a linear correspondence. This fact is discussed in terms of the structural changes induced by atoms of different atomic coordination, i.e., on the base of the dominant bonding character (which changes from purely covalent to partially ionic) and the electronic states at the top of the valence band, as the nitrogen content is increased. The effects of hydrogen, carbon, and silicon in the a-Si and a-Ge networks are also discussed in terms of the Tauc slope B-1/2 parameter.
dc.description53
dc.description7
dc.description3833
dc.description3836
dc.languageen
dc.publisherAmerican Physical Soc
dc.publisherCollege Pk
dc.publisherEUA
dc.relationPhysical Review B
dc.relationPhys. Rev. B
dc.rightsaberto
dc.sourceWeb of Science
dc.subjectSilicon
dc.subjectNitrogen
dc.subjectAlloys
dc.subjectSi
dc.titleAbsorption edge, band tails, and disorder of amorphous semiconductors
dc.typeArtículos de revistas


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