| dc.creator | Surdutovich, GI | |
| dc.creator | Kolenda, J | |
| dc.creator | Fragalli, JF | |
| dc.creator | Misoguti, L | |
| dc.creator | Vitlina, R | |
| dc.creator | Baranauskas, V | |
| dc.date | 1996 | |
| dc.date | JUN | |
| dc.date | 2014-12-16T11:32:10Z | |
| dc.date | 2015-11-26T16:55:26Z | |
| dc.date | 2014-12-16T11:32:10Z | |
| dc.date | 2015-11-26T16:55:26Z | |
| dc.date.accessioned | 2018-03-28T23:42:47Z | |
| dc.date.available | 2018-03-28T23:42:47Z | |
| dc.identifier | Thin Solid Films. Elsevier Science Sa Lausanne, v. 279, n. 41671, n. 119, n. 123, 1996. | |
| dc.identifier | 0040-6090 | |
| dc.identifier | WOS:A1996VB37200024 | |
| dc.identifier | 10.1016/0040-6090(95)08165-8 | |
| dc.identifier | http://www.repositorio.unicamp.br/jspui/handle/REPOSIP/54450 | |
| dc.identifier | http://www.repositorio.unicamp.br/handle/REPOSIP/54450 | |
| dc.identifier | http://repositorio.unicamp.br/jspui/handle/REPOSIP/54450 | |
| dc.identifier.uri | http://repositorioslatinoamericanos.uchile.cl/handle/2250/1277111 | |
| dc.description | A new method of determination of thin film anisotropy from the angular dependence of the reflectance interference patterns for s- and p-polarized light is proposed and tested experimentally. The method is based on the different phase angle dependence of polarized light on the incident angle. As a result, the interference patterns of the reflected s- and p-polarized light beams exhibit a different number of oscillations in their angular dependence. The high sensitivity of the method is shown by its application to the interference patterns of a specially prepared multilayer structure with a calculated anisotropy. | |
| dc.description | 279 | |
| dc.description | 41671 | |
| dc.description | 119 | |
| dc.description | 123 | |
| dc.language | en | |
| dc.publisher | Elsevier Science Sa Lausanne | |
| dc.publisher | Lausanne 1 | |
| dc.publisher | Suíça | |
| dc.relation | Thin Solid Films | |
| dc.relation | Thin Solid Films | |
| dc.rights | fechado | |
| dc.rights | http://www.elsevier.com/about/open-access/open-access-policies/article-posting-policy | |
| dc.source | Web of Science | |
| dc.subject | anisotropy | |
| dc.subject | multilayers | |
| dc.subject | Porous Silicon | |
| dc.subject | Ellipsometry | |
| dc.title | An interference method for the determination of thin film anisotropy | |
| dc.type | Artículos de revistas | |
