Contrast enhancement in the detection of defects in transparent layered structures: The use of optothermal interference technique in solar cell investigation

dc.creatorBatista, JA
dc.creatorMansanares, AM
dc.creatorda Silva, EC
dc.creatorVaz, CC
dc.creatorMiranda, LCM
dc.date2000
dc.date37196
dc.date2014-12-02T16:29:28Z
dc.date2015-11-26T16:53:41Z
dc.date2014-12-02T16:29:28Z
dc.date2015-11-26T16:53:41Z
dc.date.accessioned2018-03-28T23:40:51Z
dc.date.available2018-03-28T23:40:51Z
dc.identifierJournal Of Applied Physics. Amer Inst Physics, v. 88, n. 9, n. 5079, n. 5086, 2000.
dc.identifier0021-8979
dc.identifierWOS:000089813800022
dc.identifier10.1063/1.1312849
dc.identifierhttp://www.repositorio.unicamp.br/jspui/handle/REPOSIP/56993
dc.identifierhttp://www.repositorio.unicamp.br/handle/REPOSIP/56993
dc.identifierhttp://repositorio.unicamp.br/jspui/handle/REPOSIP/56993
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1276640
dc.descriptionThis article shows the enhanced sensitivity of the optothermal interference technique in the detection of local differences (nonhomogeneity in thickness and optothermal parameters), compared to the conventional optical interference, when investigating layered transparent structures. The measured signal is sensitive to the reflectance variation at the distinct interfaces, function of temperature, as well as to the optical phase lag between the reflected beams. Measurements made on solar cells show contrast of the order of 100% in the optothermal interference, while the conventional optical interference presents a contrast of only 15%. A model based on the reflectance variation at each interface describes the signal behavior as a function of modulation frequency. Theoretical calculation based on this model evidences the influence of the optothermal parameters in the signal contrast. (C) 2000 American Institute of Physics. [S0021-8979(00)04821-0].
dc.description88
dc.description9
dc.description5079
dc.description5086
dc.languageen
dc.publisherAmer Inst Physics
dc.publisherMelville
dc.publisherEUA
dc.relationJournal Of Applied Physics
dc.relationJ. Appl. Phys.
dc.rightsaberto
dc.sourceWeb of Science
dc.subjectPhotothermal Microscopy
dc.subjectDiffusivity
dc.subjectTemperature
dc.titleContrast enhancement in the detection of defects in transparent layered structures: The use of optothermal interference technique in solar cell investigation
dc.typeArtículos de revistas


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