A METHOD FOR THE DETERMINATION OF THE COMPLEX REFRACTIVE-INDEX OF NON-METALLIC THIN-FILMS USING PHOTOMETRIC MEASUREMENTS AT NORMAL INCIDENCE

dc.creatorCISNEROS, JI
dc.creatorREGO, GB
dc.creatorTOMYIAMA, M
dc.creatorBILAC, S
dc.creatorGONCALVES, JM
dc.creatorRODRIGUEZ, AE
dc.creatorARGUELLO, ZP
dc.date1983
dc.date2014-12-10T11:54:55Z
dc.date2015-11-26T16:49:38Z
dc.date2014-12-10T11:54:55Z
dc.date2015-11-26T16:49:38Z
dc.date.accessioned2018-03-28T23:36:22Z
dc.date.available2018-03-28T23:36:22Z
dc.identifierThin Solid Films. Elsevier Science Sa Lausanne, v. 100, n. 2, n. 155, n. 167, 1983.
dc.identifier0040-6090
dc.identifierWOS:A1983QE89400008
dc.identifier10.1016/0040-6090(83)90471-6
dc.identifierhttp://www.repositorio.unicamp.br/jspui/handle/REPOSIP/76051
dc.identifierhttp://www.repositorio.unicamp.br/handle/REPOSIP/76051
dc.identifierhttp://repositorio.unicamp.br/jspui/handle/REPOSIP/76051
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1275513
dc.description100
dc.description2
dc.description155
dc.description167
dc.languageen
dc.publisherElsevier Science Sa Lausanne
dc.publisherLausanne 1
dc.publisherSuíça
dc.relationThin Solid Films
dc.relationThin Solid Films
dc.rightsfechado
dc.rightshttp://www.elsevier.com/about/open-access/open-access-policies/article-posting-policy
dc.sourceWeb of Science
dc.titleA METHOD FOR THE DETERMINATION OF THE COMPLEX REFRACTIVE-INDEX OF NON-METALLIC THIN-FILMS USING PHOTOMETRIC MEASUREMENTS AT NORMAL INCIDENCE
dc.typeArtículos de revistas


Este ítem pertenece a la siguiente institución