Artículos de revistas
Dielectric relaxation time measurement in absorbing photorefractive materials
Registro en:
Optics Communications. Elsevier Science Bv, v. 178, n. 41699, n. 251, n. 255, 2000.
0030-4018
WOS:000086882800031
10.1016/S0030-4018(00)00660-X
Autor
de Oliveira, I
Frejlich, J
Institución
Resumen
We show that absorbing photorefractive materials characterized by a space-charge exponential relaxation time law exhibit an overall hologram optical erasure that is described by the so-called exponential integral function, as far as self-diffraction can be neglected. This fact is due to the bulk absorption producing an exponentially decreasing distribution of the erasure beam irradiance along the sample thickness that results in a correspondingly increasing dielectric relaxation time. The theoretical development in this paper is experimentally verified by the analysis of the holographic erasure in a nominally undoped Bi12TiO20 photorefractive crystal using the 514.5 nm laser wavelength where this material exhibits a relatively strong bulk absorption. Neglecting absorption in this experiment leads to a relaxation time that is about 4-fold larger than the actual value. (C) 2000 Published by Elsevier Science B.V. All rights reserved. 178 41699 251 255