dc.creatorRedmer, R
dc.creatorMadureira, JR
dc.creatorFitzer, N
dc.creatorGoodnick, SM
dc.creatorSchattke, W
dc.creatorScholl, E
dc.date2000
dc.date42005
dc.date2014-12-02T16:28:08Z
dc.date2015-11-26T16:36:10Z
dc.date2014-12-02T16:28:08Z
dc.date2015-11-26T16:36:10Z
dc.date.accessioned2018-03-28T23:18:48Z
dc.date.available2018-03-28T23:18:48Z
dc.identifierJournal Of Applied Physics. Amer Inst Physics, v. 87, n. 2, n. 781, n. 788, 2000.
dc.identifier0021-8979
dc.identifierWOS:000084506500026
dc.identifier10.1063/1.371941
dc.identifierhttp://www.repositorio.unicamp.br/jspui/handle/REPOSIP/66924
dc.identifierhttp://www.repositorio.unicamp.br/handle/REPOSIP/66924
dc.identifierhttp://repositorio.unicamp.br/jspui/handle/REPOSIP/66924
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1271719
dc.descriptionImpact ionization plays a crucial role for electron transport in semiconductors at high electric fields. We derive appropriate quantum kinetic equations for electron transport in semiconductors within linear response theory. The field-dependent collision integral is evaluated for the process of impact ionization. A known, essentially analytical result is reproduced within the parabolic band approximation [W. Quade , Phys. Rev. B 50, 7398 (1994)]. Based on the numerical results for zero field strengths but realistic band structures, a fit formula is proposed for the respective field-dependent impact ionization rate. Explicit results are given for GaAs, Si, GaN, ZnS, and SrS. (C) 2000 American Institute of Physics. [S0021-8979(00)03002-4].
dc.description87
dc.description2
dc.description781
dc.description788
dc.languageen
dc.publisherAmer Inst Physics
dc.publisherWoodbury
dc.publisherEUA
dc.relationJournal Of Applied Physics
dc.relationJ. Appl. Phys.
dc.rightsaberto
dc.sourceWeb of Science
dc.subjectQuantum Transport-theory
dc.subjectMonte-carlo Simulation
dc.subjectHot-electron Transport
dc.subjectBand-structure
dc.subjectZns
dc.subjectZincblende
dc.subjectEquations
dc.subjectWurtzite
dc.subjectDevices
dc.subjectSystems
dc.titleField effect on the impact ionization rate in semiconductors
dc.typeArtículos de revistas


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