Characterization of Silicon Rich Oxides with Tunable Optical Band Gap on Sapphire Substrates by Photoluminescence, UV/Vis and Raman Spectroscopy

dc.creatorKiebach, R
dc.creatorLuna-Lopez, JA
dc.creatorDias, GO
dc.creatorAceves-Mijares, M
dc.creatorSwart, JW
dc.date2008
dc.dateJUL-SEP
dc.date2014-07-30T16:51:59Z
dc.date2015-11-26T16:33:28Z
dc.date2014-07-30T16:51:59Z
dc.date2015-11-26T16:33:28Z
dc.date.accessioned2018-03-28T23:15:20Z
dc.date.available2018-03-28T23:15:20Z
dc.identifierJournal Of The Mexican Chemical Society. Soc Quimica Mexico, v. 52, n. 3, n. 212, n. 218, 2008.
dc.identifier1870-249X
dc.identifierWOS:000265761000006
dc.identifierhttp://www.repositorio.unicamp.br/jspui/handle/REPOSIP/62889
dc.identifierhttp://repositorio.unicamp.br/jspui/handle/REPOSIP/62889
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1270862
dc.descriptionA detailed analysis of the optical properties of silicon rich oxides (SRO) thin films and the factors that influence them is presented. SRO films with different Si content were synthesized via LPCVD (low pressure chemical vapor deposition) on sapphire substrates. Photoluminescence (PL), UV/Vis and Raman spectroscopy were used to characterize the samples. An intense emission in blue region was found. An interesting fact is that the optical band gap correlates linearly with the reactants ratio, which allows the tuning of the band gap. The influence of parameters such as substrate, Si content, annealing temperature and annealing time on the optical properties are discussed and the possible mechanisms of the photoluminescence are compared with our experimental data.
dc.description52
dc.description3
dc.description212
dc.description218
dc.descriptionDeutsche Forschungs Gemeinschaft
dc.descriptionCONACyT
dc.languageen
dc.publisherSoc Quimica Mexico
dc.publisherMexico D F
dc.publisherMéxico
dc.relationJournal Of The Mexican Chemical Society
dc.relationJ. Mex. Chem. Soc.
dc.rightsaberto
dc.sourceWeb of Science
dc.subjectSilicon rich oxides
dc.subjectoptical properties
dc.subjectphotoluminiscence
dc.subjectSilicon nano crystals
dc.subjectnanostructured materials
dc.subjectluminescence
dc.subjectRaman spectroscopy
dc.subjectsilicon rich oxides
dc.subjectThin-films
dc.subjectSi
dc.subjectNanocrystals
dc.subjectScattering
dc.subjectOrigin
dc.subjectLuminescence
dc.subjectEmission
dc.subjectSystems
dc.subjectLayers
dc.titleCharacterization of Silicon Rich Oxides with Tunable Optical Band Gap on Sapphire Substrates by Photoluminescence, UV/Vis and Raman Spectroscopy
dc.typeArtículos de revistas


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