dc.creatorAntonelli, A
dc.creatorJusto, JF
dc.creatorFazzio, A
dc.date1999
dc.dateAUG 15
dc.date2014-12-02T16:28:26Z
dc.date2015-11-26T16:32:15Z
dc.date2014-12-02T16:28:26Z
dc.date2015-11-26T16:32:15Z
dc.date.accessioned2018-03-28T23:13:36Z
dc.date.available2018-03-28T23:13:36Z
dc.identifierPhysical Review B. American Physical Soc, v. 60, n. 7, n. 4711, n. 4714, 1999.
dc.identifier0163-1829
dc.identifierWOS:000082241500061
dc.identifier10.1103/PhysRevB.60.4711
dc.identifierhttp://www.repositorio.unicamp.br/jspui/handle/REPOSIP/70590
dc.identifierhttp://www.repositorio.unicamp.br/handle/REPOSIP/70590
dc.identifierhttp://repositorio.unicamp.br/jspui/handle/REPOSIP/70590
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1270451
dc.descriptionWe performed a theoretical investigation of the interaction of point defects (vacancy and self-interstitials) with an intrinsic stacking fault in silicon using ab initio total-energy calculations. Defects at the fault and in the crystalline environment display a different behavior, which is evidenced by changes in formation energy and electronic structure. The formation energies for the vacancy and the [110]-split interstitial are lower at the intrinsic stacking fault than those in the crystal, indicating that in nonequilibrium conditions, intrinsic stacking faults can act, together with other extended defects, as a sink for point defects, and also that in equilibrium conditions, there can be a higher concentration of such defects at the fault than that in bulk silicon. [S0163-1829(99)03631-0].
dc.description60
dc.description7
dc.description4711
dc.description4714
dc.languageen
dc.publisherAmerican Physical Soc
dc.publisherCollege Pk
dc.publisherEUA
dc.relationPhysical Review B
dc.relationPhys. Rev. B
dc.rightsaberto
dc.sourceWeb of Science
dc.subjectStacking-faults
dc.subjectPartial Dislocations
dc.subjectMolecular-dynamics
dc.subjectAb-initio
dc.subjectSilicon
dc.subjectDiffusion
dc.subjectPseudopotentials
dc.subjectMobility
dc.subjectStates
dc.subjectModel
dc.titlePoint defect interactions with extended defects in semiconductors
dc.typeArtículos de revistas


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