Artículos de revistas
Accelerated life tests analyzed by a piecewise exponential distribution via generalized linear models
Registro en:
Ieee Transactions On Reliability. Ieee-inst Electrical Electronics Engineers Inc, v. 45, n. 4, n. 619, n. 623, 1996.
0018-9529
WOS:A1996WH55800017
10.1109/24.556584
Autor
Barbosa, EP
Colosimo, EA
LouzadaNeto, F
Institución
Resumen
Efficient industrial experiments for reliability analysis of manufactured products consist of subjecting the units to accelerated life tests, where for each pre-fixed stress level, the experiment ends after the failure of a certain prefixed proportion of units or a certain test time is reached. This paper estimates the mean life of the units under usual working conditions, based on censored data obtained from units under stress conditions. This problem is approached through a generalized linear model and related inferential techniques, considering the very flexible class of failure distributions, piecewise exponential model, and a log-linear stress-response relationship. The general framework has as particular cases, among others, the power law model, the Arrhenius model, and the generalized Eyring model. A numerical example illustrates the methodology. 45 4 619 623