dc.creator | Trasferetti, BC | |
dc.creator | Gelamo, RV | |
dc.creator | Rouxinol, FP | |
dc.creator | de Moraes, MAB | |
dc.creator | Davanzo, CU | |
dc.date | 2005 | |
dc.date | SEP 6 | |
dc.date | 2014-11-18T13:56:10Z | |
dc.date | 2015-11-26T16:27:54Z | |
dc.date | 2014-11-18T13:56:10Z | |
dc.date | 2015-11-26T16:27:54Z | |
dc.date.accessioned | 2018-03-28T23:08:52Z | |
dc.date.available | 2018-03-28T23:08:52Z | |
dc.identifier | Chemistry Of Materials. Amer Chemical Soc, v. 17, n. 18, n. 4685, n. 4692, 2005. | |
dc.identifier | 0897-4756 | |
dc.identifier | WOS:000231742600020 | |
dc.identifier | 10.1021/cm0503139o | |
dc.identifier | http://www.repositorio.unicamp.br/jspui/handle/REPOSIP/80537 | |
dc.identifier | http://www.repositorio.unicamp.br/handle/REPOSIP/80537 | |
dc.identifier | http://repositorio.unicamp.br/jspui/handle/REPOSIP/80537 | |
dc.identifier.uri | http://repositorioslatinoamericanos.uchile.cl/handle/2250/1269314 | |
dc.description | The present work describes the effects of diluting hexamethyldisilazane (HMDSN) vapor either in pure argon or in oxygen-argon mixtures on the solid film deposited from the resulting plasma. Such a dilution provides a manner of incorporating controllable amounts of Si-O groups into the solid film. The characterization of the films investigated here was made by longitudinal and transverse optical (LO and TO, respectively) functions in the mid-infrared calculated through the Kramers-Kronig analysis of transmittance spectra. The infrared analysis showed that the films were formed by silicon-centered distorted tetrahedra of the following type: Si(CH3)(x)BU(2-0.5x), where 0 <= x <= 3 and BU stands for bridging unit. For the sample deposited in the absence of O-2 in the discharge, BU = CH2 and NH; for the samples deposited with an O-2 flow rate (f(O2)) of 2.5 and 10 sccm, BU = CH2, NH, and O; and for the sample deposited with f(O2) of 20 sccm, BU = NH and O. The Delta(LO-TO) for the Si-O asymmetrical stretching increased from 0 (f(O2) = 0 sccm) to 73 cm(-1) (f(O2) = 20 sccm), while for the Si-N asymmetrical stretching it decreased from 20 (f(O2) = 0 sccm) to 3 cm(-1) (f(O2) = 20 sccm). These observations signal an increase in the Si-O-Si network and a decrease in the Si-NH-Si network as the oxygen flow increased. An interesting conclusion drawn from our analysis of the Si-H stretching mode position and Delta(LO-TO) for the AS1 band is that the films deposited in the presence of O-2 are not structurally homogeneous, but have domains with different proportions of O bridges. | |
dc.description | 17 | |
dc.description | 18 | |
dc.description | 4685 | |
dc.description | 4692 | |
dc.language | en | |
dc.publisher | Amer Chemical Soc | |
dc.publisher | Washington | |
dc.publisher | EUA | |
dc.relation | Chemistry Of Materials | |
dc.relation | Chem. Mat. | |
dc.rights | fechado | |
dc.source | Web of Science | |
dc.subject | Chemical-vapor-deposition | |
dc.subject | Amorphous Hydrogenated Carbon | |
dc.subject | Thin-films | |
dc.subject | Vibrational-spectra | |
dc.subject | Lo Modes | |
dc.subject | Optical-properties | |
dc.subject | Silicon-nitride | |
dc.subject | Ab-initio | |
dc.subject | Absorption | |
dc.subject | Spectroscopy | |
dc.title | Infrared studies on films of carbosilazane and siloxazane networks | |
dc.type | Artículos de revistas | |