Imaging of soft structures: Dependence of contrast in atomic force microscopy images on the force applied by the tip

dc.creatorTeschke, O
dc.creatorCeotto, G
dc.creatorde Souza, EF
dc.date2000
dc.dateMAY-JUN
dc.date2014-12-02T16:28:11Z
dc.date2015-11-26T16:25:55Z
dc.date2014-12-02T16:28:11Z
dc.date2015-11-26T16:25:55Z
dc.date.accessioned2018-03-28T23:06:38Z
dc.date.available2018-03-28T23:06:38Z
dc.identifierJournal Of Vacuum Science & Technology B. Amer Inst Physics, v. 18, n. 3, n. 1144, n. 1150, 2000.
dc.identifier1071-1023
dc.identifierWOS:000087654200004
dc.identifier10.1116/1.591350
dc.identifierhttp://www.repositorio.unicamp.br/jspui/handle/REPOSIP/69243
dc.identifierhttp://www.repositorio.unicamp.br/handle/REPOSIP/69243
dc.identifierhttp://repositorio.unicamp.br/jspui/handle/REPOSIP/69243
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1268740
dc.descriptionForces acting on atomic force microscope tips during scanning of films of ionic surfactant molecules adsorbed from aqueous solutions onto hydrophilic substrates are measured. Near critical micellar concentration images of mica substrates show aggregate regions at the interface. Force versus distance curves indicate that aggregates are the thickest adsorbed structures on the substrate. However, topographic images registered at low scanning speed (15 mu m/s) show that these aggregates appear as holes, consequently observed as inverted in contrast images, Tn atomic force microscope imaging of soft structures such as surfactants or biological material, inverted images may be observed when the tip penetrates the scanned layers. This penetration can be adjusted by changing the force applied by the tip, which results in different images. In order to obtain the conventional atomic force microscope contrast in scanned images the applied force set point is determined by the analysis of the force versus distance curves. (C) 2000 American Vacuum Society. [S0734-211X(00)11803-7].
dc.description18
dc.description3
dc.description1144
dc.description1150
dc.languageen
dc.publisherAmer Inst Physics
dc.publisherMelville
dc.publisherEUA
dc.relationJournal Of Vacuum Science & Technology B
dc.relationJ. Vac. Sci. Technol. B
dc.rightsaberto
dc.sourceWeb of Science
dc.subjectHexadecyltrimethylammonium Bromide
dc.subjectNeutron Reflection
dc.subjectSilicon Surfaces
dc.subjectDouble-layer
dc.subjectAdsorption
dc.subjectFilms
dc.titleImaging of soft structures: Dependence of contrast in atomic force microscopy images on the force applied by the tip
dc.typeArtículos de revistas


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