dc.creatorde Souza, RAA
dc.creatorYacoub, MD
dc.date2010
dc.dateJAN
dc.date2014-11-15T05:35:19Z
dc.date2015-11-26T16:09:33Z
dc.date2014-11-15T05:35:19Z
dc.date2015-11-26T16:09:33Z
dc.date.accessioned2018-03-28T22:58:09Z
dc.date.available2018-03-28T22:58:09Z
dc.identifierIeee Transactions On Wireless Communications. Ieee-inst Electrical Electronics Engineers Inc, v. 9, n. 1, n. 45, n. 50, 2010.
dc.identifier1536-1276
dc.identifierWOS:000273567500008
dc.identifier10.1109/TWC.2010.01.090030
dc.identifierhttp://www.repositorio.unicamp.br/jspui/handle/REPOSIP/78170
dc.identifierhttp://www.repositorio.unicamp.br/handle/REPOSIP/78170
dc.identifierhttp://repositorio.unicamp.br/jspui/handle/REPOSIP/78170
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1266651
dc.descriptionAn infinite series formulation for the multivariate alpha-mu joint probability density function with arbitrary correlation matrix and non-identically distributed variates is derived. The expression is exact and general and includes all of the results previously published in the literature concerning the distributions comprised by the alpha-mu distribution. The general expression is then particularized to an indeed very simple, approximate closed-form solution. In addition, a multivariate joint cumulative distribution function is obtained, again in simple, closed-form manner. As an application example, the exact and approximate performances of the selection combining scheme given in terms of the outage probability is shown. Approximate and exact results are very close to each other for small as well as medium values of correlation.
dc.description9
dc.description1
dc.description45
dc.description50
dc.languageen
dc.publisherIeee-inst Electrical Electronics Engineers Inc
dc.publisherPiscataway
dc.publisherEUA
dc.relationIeee Transactions On Wireless Communications
dc.relationIEEE Trans. Wirel. Commun.
dc.rightsfechado
dc.rightshttp://www.ieee.org/publications_standards/publications/rights/rights_policies.html
dc.sourceWeb of Science
dc.subjectCorrelated fading
dc.subjectalpha-mu distribution
dc.subjectdiversity systems
dc.subjectNakagami-m fading
dc.subjectNakagami-m Distribution
dc.subjectFading Parameters
dc.titleThe Multivariate alpha-mu Distribution
dc.typeArtículos de revistas


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