dc.creatorMuniz, LR
dc.creatorRibeiro, CTM
dc.creatorZanatta, AR
dc.creatorChambouleyron, I
dc.date2007
dc.dateFEB 21
dc.date2014-11-14T17:27:07Z
dc.date2015-11-26T16:07:43Z
dc.date2014-11-14T17:27:07Z
dc.date2015-11-26T16:07:43Z
dc.date.accessioned2018-03-28T22:56:23Z
dc.date.available2018-03-28T22:56:23Z
dc.identifierJournal Of Physics-condensed Matter. Iop Publishing Ltd, v. 19, n. 7, 2007.
dc.identifier0953-8984
dc.identifierWOS:000244153100018
dc.identifier10.1088/0953-8984/19/7/076206
dc.identifierhttp://www.repositorio.unicamp.br/jspui/handle/REPOSIP/77274
dc.identifierhttp://www.repositorio.unicamp.br/handle/REPOSIP/77274
dc.identifierhttp://repositorio.unicamp.br/jspui/handle/REPOSIP/77274
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1266204
dc.descriptionThe present work contributes to establishing the role of hydrogenation and of the substrates in the aluminium-induced crystallization process of amorphous germanium layers. For such a purpose, four series of a-Ge(Al) samples, deposited under identical nominal conditions, were studied: hydrogenated samples, H-free samples, and samples deposited on crystalline silicon and on glass substrates, respectively. On purpose, the impurity concentration was kept at a doping level (10(-5) < [Al/Ge] < 2 x 10(-3)). Furthermore, the films were submitted to isochronal cumulative thermal annealing in the 200-550 degrees C range. Raman scattering spectroscopy was used to characterize the crystallization process. The role of Al impurity as a precursor seed for the crystallization of a-Ge:H has been clearly established, confirming that the metal-induced crystallization ( MIC) phenomenon occurs at an atomic level. Moreover, it has been found that hydrogenation and the periodic nature of the substrate play a fundamental role in the appearance of crystal seeds at low temperatures. The evolution of crystallization with annealing temperature and the analysis of the distribution of crystallite sizes indicate that the formation of crystal seeds occurs at the amorphous film-substrate interface. The importance of fourfold-coordinated aluminium as the embryo of nanocrystal formation is discussed.
dc.description19
dc.description7
dc.languageen
dc.publisherIop Publishing Ltd
dc.publisherBristol
dc.publisherInglaterra
dc.relationJournal Of Physics-condensed Matter
dc.relationJ. Phys.-Condes. Matter
dc.rightsfechado
dc.rightshttp://iopscience.iop.org/page/copyright
dc.sourceWeb of Science
dc.subjectSolid-phase Epitaxy
dc.subjectAl-induced Crystallization
dc.subjectGermanium Thin-films
dc.subjectAmorphous-germanium
dc.subjectRaman-spectrum
dc.subjectSilicon
dc.subjectStress
dc.subjectScattering
dc.subjectSize
dc.subjectMechanisms
dc.titleAluminium-induced nanocrystalline Ge formation at low temperatures
dc.typeArtículos de revistas


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