Elastic Electron Scattering By Silane In The Low-energy Range

dc.creatorLee M.T.
dc.creatorMachado L.E.
dc.creatorBrescansin L.M.
dc.date1999
dc.date2015-06-30T15:20:02Z
dc.date2015-11-26T15:26:00Z
dc.date2015-06-30T15:20:02Z
dc.date2015-11-26T15:26:00Z
dc.date.accessioned2018-03-28T22:34:46Z
dc.date.available2018-03-28T22:34:46Z
dc.identifier
dc.identifierJournal Of Molecular Structure: Theochem. , v. 464, n. 1-3, p. 79 - 86, 1999.
dc.identifier1661280
dc.identifier10.1016/S0166-1280(98)00537-5
dc.identifierhttp://www.scopus.com/inward/record.url?eid=2-s2.0-0033580535&partnerID=40&md5=c013b9b703ff3d43e5812a079223f18d
dc.identifierhttp://www.repositorio.unicamp.br/handle/REPOSIP/100967
dc.identifierhttp://repositorio.unicamp.br/jspui/handle/REPOSIP/100967
dc.identifier2-s2.0-0033580535
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1261037
dc.descriptionElastic differential, integral and momentum-transfer cross sections are reported for electron scattering by SiH4 at impact energies ranging from 0.1 to 40 eV. A new code based on the Schwinger iterative variational method in the fixed-nuclei, static-exchange plus correlation-polarization approximation is used to calculate the scattering amplitudes. Our calculated cross sections are in general good agreement with the available experimental data as well as with some recent theoretical results. The new code is also able to reproduce the Ramsauer-Townsend minimum at 0.2 eV and the resonance at 3 eV. The good results of the present application reinforce the reliability of our method.
dc.description464
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dc.description79
dc.description86
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dc.languageen
dc.publisher
dc.relationJournal of Molecular Structure: THEOCHEM
dc.rightsfechado
dc.sourceScopus
dc.titleElastic Electron Scattering By Silane In The Low-energy Range
dc.typeActas de congresos


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