dc.creatorAlves M.A.R.
dc.creatorDa Silva Braga E.
dc.creatorFissore A.
dc.creatorCescato L.
dc.date1998
dc.date2015-06-30T15:07:13Z
dc.date2015-11-26T15:20:01Z
dc.date2015-06-30T15:07:13Z
dc.date2015-11-26T15:20:01Z
dc.date.accessioned2018-03-28T22:29:32Z
dc.date.available2018-03-28T22:29:32Z
dc.identifier
dc.identifierVacuum. , v. 49, n. 3, p. 213 - 215, 1998.
dc.identifier0042207X
dc.identifier
dc.identifierhttp://www.scopus.com/inward/record.url?eid=2-s2.0-0000816313&partnerID=40&md5=af04543b2248820c591c30b2001bdd7d
dc.identifierhttp://www.repositorio.unicamp.br/handle/REPOSIP/100722
dc.identifierhttp://repositorio.unicamp.br/jspui/handle/REPOSIP/100722
dc.identifier2-s2.0-0000816313
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1259879
dc.descriptionThe stripping of amorphous hydrogenated carbon films (a-C:H) using an rf oxygen plasma has been monitored using the optical emission from electronically excited CO, H and O species in the visible region of the spectrum. The end point has been detected by monitoring the emission intensity of O reactive species (777.2 nm) and CO emission (483.5 nm) intensity of the etching product. © 1998 Elsevier Science Ltd. All rights reserved.
dc.description49
dc.description3
dc.description213
dc.description215
dc.descriptionHolland, L., Ojha, S.M., (1976) Thin Solid Films, 38, pp. L17-L19
dc.descriptionHolland, L., Ojha, S.M., (1979) Thin Solid Films, 58, p. 107
dc.descriptionAngus, J.C., Koidl, P., Domitz, S., (1986) Plasma Deposited Thin Films, , eds. J. Mort and F. Jansen Chemical Rubber, Boca Raton, FL
dc.descriptionBubenzer, A., Dischler, B., Brandt, G., Koidl, P., (1983) J. Appl. Phys., 54, p. 4590
dc.descriptionKakuchi, M., Hikita, M., Tamamura, T., (1986) Appl. Phys. Lett., 48, p. 835
dc.descriptionKragler, K., Günther, E., Leuschner, R., Falk, G., Hammerschmidt, A., Seggern, H., Von Saemann-Ischenko, G., (1995) Appl. Phys. Lett., 67, p. 1163
dc.languageen
dc.publisher
dc.relationVacuum
dc.rightsfechado
dc.sourceScopus
dc.titleOptical Emission End Point Detecting For Monitoring Oxygen Plasma A-c:h Stripping
dc.typeArtículos de revistas


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