dc.creatorTorres E.A.
dc.creatorRamirez A.J.
dc.date2011
dc.date2015-06-30T20:43:44Z
dc.date2015-11-26T14:54:21Z
dc.date2015-06-30T20:43:44Z
dc.date2015-11-26T14:54:21Z
dc.date.accessioned2018-03-28T22:06:15Z
dc.date.available2018-03-28T22:06:15Z
dc.identifier
dc.identifierScience And Technology Of Welding And Joining. , v. 16, n. 1, p. 68 - 78, 2011.
dc.identifier13621718
dc.identifier10.1179/136217110X12785889550028
dc.identifierhttp://www.scopus.com/inward/record.url?eid=2-s2.0-79251503296&partnerID=40&md5=c60d77e17eabe47f44890693adf27c96
dc.identifierhttp://www.repositorio.unicamp.br/handle/REPOSIP/109012
dc.identifierhttp://repositorio.unicamp.br/jspui/handle/REPOSIP/109012
dc.identifier2-s2.0-79251503296
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1255130
dc.descriptionElectron microscopy has been an important technique for the advancement of materials and joining science allowing studies from the macro- to the atomic scale. Such studies are normally performed ex situ, i.e. the material is analysed before and after it has been submitted to an external condition such as welding, deformation and/or heat treatment. Nevertheless, researchers have always looked for experimental approaches to study dynamic processes in real time, i.e. in situ. In the last few decades, advances in electron microscopy have made possible the implementation of in situ experiments that mimic production and service conditions within both transmission electron microscopes (TEM) and scanning electron microscopes (SEM), depending on the scale, material and phenomenon of interest. In the study presented here, the advantages and challenges associated with in situ SEM experiments are discussed with particular focus on structural materials. An introduction to SEM and in situ experiments, their features, limitations, challenges, and the associated instrumentation is given, followed by a review of relevant research work in this field. © 2011 Institute of Materials, Minerals and Mining.
dc.description16
dc.description1
dc.description68
dc.description78
dc.descriptionBogner, A., Jouneau, P.H., Thollet, G., Basset, D., Gauthier, C., (2007) Micron, 38, pp. 390-401
dc.descriptionWells, O.C., Joy, D.C., (2006) Surf. Interface Anal., 38, pp. 1738-1742
dc.descriptionRochow, T.G., Tucker, P.A., (1994) Introduction to Microscopy by Means of Light, Electrons, X Rays, Or acoustics, pp. 12-15. , 2nd edn, New York, Plenum Press
dc.descriptionBanhart, F., (2008) In Situ Electron. Microscopy at High resolution, p. 311. , Singapore, World Scientific Publishing Company
dc.descriptionBasu, J., Divakar, R., Winterstein, J.P., Ravishankar, N., Carter, C.B., (2008) Microsc. Microanal., 14 (2), pp. 246-247
dc.descriptionImura, T., (1993) Microsc. Microanal. Microstruct., 4, pp. 101-110
dc.descriptionNewbury, D.E., Williams, D.B., (2000) Acta Mater., 48, pp. 323-346
dc.descriptionHomma, Y., (2003) Microsc. Microanal., 9 (2), pp. 910-911
dc.descriptionGoldstein, J.I., (1992) Scanning Electron. Microscopy and X-ray microanalysis, p. 820. , 2nd edn, New York, Plenum Press
dc.descriptionWilliams, D.B., Carter, C.B., (1996) Transmission Electron. Microscopy, p. 729. , 1st edn, New York, Plenum Press
dc.descriptionReimer, L.L., (1998) Scanning Electron. Microscopy, p. 527. , 2nd edn, Berlin, Springer-Verlag
dc.descriptionTorres, E.A., Peternella, F.G., Ramirez, A.J., (2009) Proc. 8th Int. Conf. on 'Trends in Welding research', pp. 354-357. , ed. S. A. David et al., Materials Park, OH, ASM International
dc.descriptionHemker, K.J., Sharpe Jr., W.N., (2007) Annu. Rev. Mater. Res., 37, pp. 93-126
dc.descriptionThiel, B.L., Toth, M., (2005) J. Appl. Phys., 97, p. 051101
dc.descriptionHöppel, H.W., Nolte, R., Göken, M., (2007) Microsc. Microanal., 13 (2), pp. 1112-1113
dc.descriptionHowie, A., (2002) Microsc. Microanal., 8 (2), pp. 404-405
dc.descriptionJoy, D.C., Joy, C.S., (1996) Micron, 27, pp. 247-263
dc.descriptionStach, E.A., (2005) Microsc. Microanal., 11 (2), p. 686
dc.descriptionLin, D., Chen, D., (1989) Mater. Res. Soc. Symp. Proc., 133, pp. 217-223
dc.descriptionGregori, G., Kleebe, H.J., (2002) J. Electron. Microsc., 51 (6), pp. 347-352
dc.descriptionAndersson, H., Persson, C., (2004) Int. J. Fatigue, 26, pp. 211-219
dc.descriptionLaVan, D.A., Sharpe, W.N., (1999) Exp. Mech., 39 (3), pp. 210-216
dc.descriptionHaque, M.A., Saif, M.T., (2002) Exp. Mech., 42 (1), pp. 123-128
dc.descriptionKinaev, N.N., Cousens, D.R., Atrens, A., (1999) J. Mater. Sci., 34, pp. 4909-4920
dc.descriptionZhang, X.P., Wang, C.H., Ye, L., Mai, W., (2002) Fatigue Fract. Eng. Mater. Struct., 25 (2), pp. 141-150
dc.descriptionZupan, M., Hayden, M.J., Boehlert, C.J., Hemker, K.J., (2001) Exp. Mech., 41 (3), pp. 242-247
dc.descriptionTong, W., Tao, H., Jiang, X., Zhang, N., Marya, M.P., (2005) Met. Al.l. Mater. Trans. A, 36 A, pp. 2651-2669
dc.descriptionBerfield, T.A., Patel, J.K., (2007) Exp. Mech., 47, pp. 51-62
dc.descriptionFrotscher, M., Neuking, K., Böckmann, R., Wolff, K.-D., Eggeler, G., (2008) Mater. Sci. Eng. A, A481-A482, pp. 160-165
dc.descriptionBiallas, G., Maier, H.J., (2007) Int. J. Fatigue, 29, pp. 1413-1425
dc.descriptionHaque, M.A., Saif, M.T.A., (2001) J. Microelectromech. Syst., 10 (1), pp. 146-152
dc.descriptionHan, J.H., Saif, M.T.A., (2006) Rev. Sci. Instrum., 77, p. 045102
dc.descriptionLarsen, K.P., Rasmessen, A.A., Ravnkilde, J.T., Ginnerup, M., Hansen, O., (2003) Sens. Actuators A, 1003 A, pp. 156-164
dc.descriptionSharma, R., Crozier, P.A., Treacy, M.M.J., (2006) Dynamic in Situ Electron. Microscopy as A Tool to Meet the Challenges of the nanoworld, , NSF workshop report, NSF, Arlington, VA, USA
dc.descriptionTsung, L., Mollon, B., Pan, M., Jia, Y., Mooney, P., Mao, C., (2008) Microsc. Microanal., 14 (2), pp. 808-809
dc.descriptionFriel, J.J., Lyman, C.E., (2006) Microsc. Microanal., 12 (1), pp. 2-25
dc.descriptionLechner, P., Fiorini, C., Hartmann, R., (2001) Nucl. Instrum. Methods Phys. Res. Sect. A, 458 A, pp. 281-287
dc.descriptionField, D.P., (2005) Microsc. Microanal., 11 (2), pp. 52-53
dc.descriptionMaitland, T.M., (2004) Microsc. Microanal., 10 (2), pp. 936-937
dc.descriptionMaitland, T.M., Gholinia, A., (2007) Microsc Microanal., 13 (2), pp. 924-925
dc.descriptionWright, S.I., Nowell, M.M., (2006) Microsc. Microanal., 12, pp. 72-84
dc.descriptionWuhrer, R., Moran, K., (2009) Microsc. Microanal., 15 (2), pp. 30-31
dc.descriptionVan Der Mast, K.D., (2001), US Patent 6, 184, 525 B1Fielden, I.M., Rodenburg, J.M., (2004) Mater. Sci. Forum., 467-470, pp. 1385-1388
dc.descriptionKnowles, W.R., Hardt, T.A., (2000), US Patent 6, 025, 592Brazilian Patent 0000220703897877 2007Torres, E.A., (2008) Development of SEM In-situ High Temperaturedeformation Test and its Application to the Study of Ductility Dip Cracking Phenomenon on Ni-base alloys, , MSc dissertation, Campinas State University, Campinas, Brazil
dc.descriptionDanilatos, G.D., (1994) Mikrochim. Acta, 114-115, pp. 143-155
dc.descriptionStokes, D.J., (2003) Philos. Trans. R. Soc. Lond. A, 361 A, pp. 2771-2787
dc.descriptionToth, M., Knowles, W.R., Thiel, B.L., (2006) Appl. Phys. Lett., 88, p. 023105
dc.descriptionErhart, H., Wang, R., Rapp, R., (1984) Oxid. Met., 21 (1-2), pp. 81-88
dc.descriptionGamo, K., (1996) Microelectron. Eng., 32, pp. 159-171
dc.descriptionGiannuzzia, L.A., Stevieb, F.A., (1999) Micron, 30, pp. 197-204
dc.descriptionPhaneuf, M.W., (1999) Micron, 30, pp. 277-288
dc.descriptionShigesato, G., Sugiyama, M., (2002) J. Electron. Microsc., 51, pp. 359-367
dc.descriptionRzepiejewska-Malyska, K., Parlinska-Wojtan, M., Wasmer, K., Hejduk, K., Michler, J., (2009) Micron, 40, pp. 22-27
dc.description(2004) Standard Test Methods for Tension Testing of Met. Al.lic materials, , ASTM E8M-04, ASTM, West Conshohocken, PA, USA
dc.descriptionImura, T., (1979) J. Electron. Microsc., 28, pp. 37-40
dc.descriptionVreeling, J.A., Oceli'k, V., Hamstra, G.A., Pei, Y.T., De Hosson, J.Th.M., (2000) Scr. Mater., 42, pp. 589-595
dc.descriptionRichter, R., Tirschler, W., Blochwitz, C., (2001) Mater. Sci. Eng. A, A313 (1-2), pp. 237-243
dc.descriptionYawny, A.A., Ipina, J.E.P., (2003) J. Test. Eval., 31 (5), pp. 413-422
dc.descriptionBertolino, G., Meyer, G., Ipiña, J.P., (2003) J. Nucl. Mater., 322, pp. 57-65
dc.descriptionHosseini, S.B., Temmel, C., (2007) Met. Al.l. Mater. Trans. A, 38 A (5), pp. 982-989
dc.descriptionJacobsson, L., Persson, C., Melin, S., (2008) Mater. Sci. Eng. A, A496, pp. 200-208
dc.descriptionIannello, M.-A., Tsung, L., (2005) Microelectron. Reliab., 45, pp. 1526-1531
dc.descriptionRamirez, A.J., Lippold, J.C., (2004) Mater. Sci. Eng. A, A380 (1-2), pp. 245-258
dc.descriptionRamirez, A.J., Lippold, J.C., (2004) Mater. Sci. Eng. A, A380 (1-2), pp. 259-271
dc.descriptionRamirez, A.J., Sowards, J.W., Lippold, J.C., (2006) J. Mater. Process. Technol., 179 (1-3), pp. 212-218
dc.descriptionKishimoto, S., Huimin, X., Shinya, N., (2000) Opt. Lasers Eng., 34, pp. 1-14
dc.descriptionXing, Z.X., Wells, L.G., Yaping, J., Shearer, A., (1997) J. Terramechan., 32 (2), pp. 73-82
dc.descriptionFranke, E.A., Wenzel, D.J., Davidson, D.L., (1991) Rev. Sci. Instrum., 62 (5), pp. 1270-1279
dc.descriptionHung, P.C., Voloshin, A.S., (2003) J. Braz. Soc. Mech. Sci. Eng., 25 (3), pp. 215-221
dc.descriptionNissley, N.E., (2006) Intermediate Temperature Grain Boundary Embrittlement in Nickel-base Weld Met. al.s, , PhD dissertation, The Ohio State University, Columbus, OH, USA
dc.descriptionPark, K.K., Oh, S.T., Baeck, S.M., Kim, D.I., Han, J.H., Han, H.N., Park, S.H., Oh, K.H., (2002) Mater. Sci. Forum., 571, pp. 408-412
dc.descriptionSeward, G.G.E., Celotto, S., Prior, D.J., Wheeler, J., Pond, R.C., (2004) Acta Mater., 52, pp. 821-832
dc.descriptionWright, S.I., Nowell, M.N., (2005) Microsc. Microanal., 11 (2), pp. 672-673
dc.descriptionBestmann, M., Piazolo, S., Spiers, C.J., Prior, D.J., (2005) J. Struct. Geol., 27, pp. 447-457
dc.descriptionPrior, D.J., Bestmann, M., Piazolo, S., Seaton, N.C., Tatham, D.J., Wheeler, J., (2007) Microsc. Microanal., 13 (2), pp. 922-923
dc.descriptionDougherty, L.M., Robertson, I.M., Vetrano, J.S., (2003) Acta Mater., 51, pp. 4367-4378
dc.descriptionNowell, M.M., Field, D.P., Wright, S.I., Dingley, D., Scutts, P., Suzuki, S., (2005) Microsc. Microanal., 11 (2), pp. 1494-1495
dc.descriptionMichael, J.R., Goldstein, J.I., (2005) Microsc. Microanal., 11 (2), pp. 1324-1325
dc.descriptionMishra, R.K., Kubic Jr., R., (2008) Microsc. Microanal., 14 (2), pp. 552-553
dc.descriptionPrior, D., Seward, G., Bestmann, M., Piazolo, S., Wheeler, J., (2003) Microsc. Microanal, 9 (2), pp. 78-79
dc.descriptionWagner, J., Hunková, M., Schmied, M., Mulders, H., Novak, M., (2006) Microsc. Microanal., 12 (2), pp. 1442-1443
dc.descriptionSchaffer, M., Wagner, J., Schaffer, B., Schmied, M., Mulders, H., (2007) Ultramicroscopy, 107, pp. 587-597
dc.descriptionMulders, J.L., Fraser, H.L., (2005) Microsc. Microanal., 11 (2), pp. 506-507
dc.descriptionGholinia, A., Brough, I., Humphreys, J., McDonald, D., Bate, P., (2009) Microsc. Microanal., 15 (S2), pp. 406-407
dc.descriptionWheeler, R., Shade, P.A., Uchic, M.D., Kerns, R., Fraser, H.L., (2006) Microsc. Microanal., 12 (S2), pp. 68-69
dc.descriptionShade, P.A., Wheeler, R., Choi, Y.S., Uchic, M.D., Dimiduk, D., Fraser, H.L., (2009) Microsc. Microanal., 15 (S2), pp. 50-51
dc.descriptionWheeler, R., Shade, P.A., Uchic, M.D., Dimiduk, D., Shiveley, A., Sergison, D., Fraser, H.L., (2008) Microsc. Microanal., 14 (S2), pp. 100-101
dc.descriptionMotz, C., Schöberl, T., Pippan, R., (2005) Acta Mater., 53, pp. 4269-4279
dc.descriptionMacCallum, D., Knorovvsky, G., Nowak-Neely, B., Proc. 7th Int. Conf. on 'Trends in Welding research', pp. 453-457. , Pine Mountains, GA, USA, June 2006, ASM International
dc.descriptionKnorovvsky, G., MacCallum, D., Holm, E.A., Michael, J.R., Nowak-Neely, B., (2006) Proc. 7th Int. Conf. on 'Trends in Welding research', pp. 447-452. , Pine Mountain, GA, USA, June, ASM International
dc.descriptionLyman, C.E., (2006) Microsc. Microanal., 12, p. 1
dc.descriptionFriel, J.J., Lyman, C.E., (2006) Microsc. Microanal., 12, pp. 2-25
dc.descriptionNewbury, D.E., (2006) Microsc. Microanal., 12 (2), pp. 818-819
dc.descriptionNewbury, D.E., (2006) Microsc. Microanal., 12, pp. 26-35
dc.descriptionWuhrer, R., Moran, K., Phillips, M.R., (2008) Microsc. Microanal., 14 (2), pp. 1108-1109
dc.descriptionAnderhalt, R., Chan, D., Lupu, M., (2009) Microsc. Microanal., 15 (2), pp. 530-531
dc.descriptionNowell, M.M., Wright, S.I., (2009) Microsc. Microanal., 15 (2), pp. 178-179
dc.descriptionGodfrey, A., (2005) Microsc. Microanal., 11 (2), pp. 518-519
dc.languageen
dc.publisher
dc.relationScience and Technology of Welding and Joining
dc.rightsfechado
dc.sourceScopus
dc.titleIn Situ Scanning Electron Microscopy
dc.typeArtículos de revistas


Este ítem pertenece a la siguiente institución