Size-controllable Synthesis And Characterization Of Wide Band Gap Semiconductor Oxide Nanoparticles

The preparation of nanoparticles dispersed into solid hosts is nowadays attracting scientific and technological interest because the properties of these hybrid systems are different and often improved, compared with their isolated counterparts. In this chapter we revise the synthesis of controlled-size semiconductor oxide nanoparticles based on the impregnation and decomposition of transition-metal 2-ethylhexanoate-based precursors in mesoporous hosts aiming to prepare MO2 (M = Ti, Ce, and Sn). The pore size of the host material can control the size of the guest material synthesized within it. The linear mass gain for each cycle in the synthesis process is an advantage of this method, because it allows the control of nanoparticle growth via a layer-by-layer assembly. We discuss the results of X-ray diffraction, transmission electron microscopy, and Raman spectroscopy for SnO2, TiO2 and CeO2 nanocrystals. Raman spectroscopy dependence on nanocrystal size allows the use of this technique as prompt characterization tool for estimating nanocrystal size. © 2010 by Nova Science Publishers, Inc. All rights reserved.

295

321

Moriarty, P., (2001) Rep. Prog. Phys, 64, pp. 297-381

Burda, C., Chen, X.B., Narayanan, R., El-Sayed, M.A., (2005) Chem. Rev, 105, pp. 1025-1102

Wang, Y., Herron, N., (1991) J. Phys. Chem, 95, pp. 525-532

Trindade, T., O'Brien, P., Pickett, N.L., (2001) Chem. Mater, 13, pp. 3843-3858

Murray, C.B., Kagan, C.R., Bawendi, M.G., (2000) Annu. Rev. Mater. Sci, 30, pp. 545-610

Preining, O.J., (1998) Aerosol Sci, 29, pp. 481-495

Cassagneau, T., Hix, G.B., Jones, D.J., Torres, P.M., Rhomari, M., Rozière, J., (1994) J. Mater. Chem, 4, pp. 189-195

Chanèac, C., Tronc, E., Jolivet, J.P., (1996) J. Mater. Chem, 6, pp. 1905-1911

Bard, A.J., Integrated chemical systems - A chemical approach to nanotechnology (1994), Wiley: New YorkAnpo, M., Aikawa, N., Kobukawa, Y., Che, M., Louis, C., Giamello, E., (1985) J. Phys. Chem, 89, pp. 5017-5021

Xu, W., Raftery, D.J., (2001) Phys. Chem. B, 105, pp. 4343-4349

Batzill, M., Diebold, U., (2005) Prog. Surf. Sci, 79, pp. 47-154

Carp, O., Huisman, C.L., Reller, A., (2004) Prog. Solid State Chem, 32, pp. 33-177

Trovarelli, A., (1996) Catal. Rev. Sci. Eng, 38, pp. 439-520

Darsillo, M.S., Gafney, H.D., Paquete, M.S., (1987) J. Am. Chem. Soc, 109, pp. 3275-3286

Kim, J.C., Kim, Y.N., Chin, E.O., Hura, N.H., Yoon, S.B., Yu, J.S., (2003) J. Mater. Res, 18, pp. 780-783

Kasuga, T., Kume, H., Abe, Y., (1997) J. Am. Ceram. Soc, 80, pp. 777-780

Reisfeld, R., Saraidarov, T., Minti, H., Wodnicka, K., (2003) Opt. Appl, 33, pp. 61-73

Sunil, D., Gafney, H.D., Rafailovich, M.H., Sokolov, J., Gambino, R.J., Huang, D.M., (2003) J. Non-Cryst. Solids, 319, pp. 154-162

Cao, G., Rabenberg, L.K., Nunn, C.M., Mallouk, T.E., (1991) Chem. Mater, 3, pp. 149-156

Zarbin, A.J.G., Vargas, M.D., Alves, O.L., (1999) J. Mater. Chem, 9, pp. 519-523

Maia, D.J., De Paoli, M.A., Alves, O.L., Zarbin, A.J.G., Neves, S., (2000) Quím. Nova, 23, pp. 204-215

Gimenez, I.F., Alves, O.L., (2002) Glass Technol, 43 C, pp. 166-169

Sotomayor, P.T., Raimundo Jr., I.V., Zarbin, A.J.G., Rohwedder, J.J.R., Oliveira Neto, G., Alves, O.L., (2001) Sens.Actuators B, 74, pp. 157-162

Khushalani, D., Hasenzahl, S., Mann, S., (2001) J. Nanosci. Nanotechnol, 1, pp. 129-132

Wang, S.P., Westcott, S., Chen, W., (2002) J. Phys. Chem. B, 106, pp. 11203-11209

Mazali, I.O., Alves, O.L., (2001) J. Mater. Sci. Lett, 20, pp. 2113-2117

Volf, M.B., Technical approach to glass (1990), Elsevier : AmsterdamAlves, O.L., Ronconi, C.M., Galembeck, A., (2002) Quím. Nova, 25, pp. 69-77

Mazali, I.O., Alves, O.L., (2005) J. Phys. Chem. Solids, 66, pp. 37-46

Mazali, I.O., Souza Filho, A.G., Neto, B.C.V., Mendes Filho, J., Alves, O.L., (2006) J. Nanoparticle Res, 8, pp. 141-148

Mazali, I.O., Romano, R., Alves, O.L., (2006) Thin Solid Films, 495, pp. 64-67

Mazali, I.O., Viana, B.C., Alves, O.L., Mendes Filho, J., Souza Filho, A.G., (2007) J. Phys. Chem. Solids, 68, pp. 622-627

Cangussu, D.C.C., Nunes, W.C., Correa, H.L.S., Knobel, M., Macedo, W.A.A., Alves, O.L., Souza Filho, A.G., Mazali, I.O., (2009) J. Appl. Phys, 105, pp. 013901-013907

Mazali, I.O., Alves, O.L., (2004) J. Mater. Sci, 39, pp. 1987-1995

www.corning.com/docs/specialtymaterials/pisheets/Vycor%207930.pdf, Available inVest, R.W., (1990) Ferroelectrics, 102, pp. 53-68

Vest, R.W., Singaram, S., (1986) Mater. Res. Soc. Symp. Proc, 60, pp. 35-42

Hagemeyer, A., Hogan, Z., Schlichter, M., Smaka, B., Streukens, G., Turner, H., Volpe Jr., A., Yaccato, K., (2007) Appl. Catal. A, 317, pp. 139-148

Wang, S., Huang, J., Zhao, Y., Wang, S., Wu, S., Zhang, S., Huang, W., (2006) Mater. Lett, 60, pp. 1706-1709

Khakpash, N., Simchi, A., Kohi, P., (2009) J. Alloys Comp, 470, pp. 289-293

Epifani, M., Comini, E., Diaz, R., Arbiol, J., Siciliano, P., Sberveglieri, G., Morante, J.R., (2006) Sens. Actuators B, 118, pp. 105-109

Zhao, Y., Zhou, Q., Liu, L., Xu, J., Yan, M., Jiang, Z., (2006) Electrochim. Acta, 51, pp. 2639-2645

Bose, A.C., Kalpana, D., Thangadurai, P., Ramasamy, S., (2002) J. Power Sources, 107, pp. 138-141

Wu, Q.H., Song, J., Kang, J., Dong, Q.F., Wu, S.T., Sun, S.G., (2007) Mater. Lett, 61, pp. 3679-3684

Baraton, M.I., Merhari, L., Ferkel, H., Castagnet, J.F., (2002) Mater. Sci. Eng. C, 18, pp. 315-321

Lee, K., Lee, D., Ahn, H., (2004) Mater. Lett, 58, pp. 3122-3125

Jenkins, R., Snyder, R.L., Introduction to X-ray powder diffractometry (1996), Wiley: New YorkPowder Diffraction File Search Manual-Inorganic (1973) Published by the Joint Committee on Powder Diffractions Standards, , Card 41-1445

Anandan, S., Yoon, M., (2003) J. Photochem. Photobiol. C, 4, pp. 5-18

Linseblinger, A.L., Lu, G.Q., Yates, J.T., (1995) Chem. Rev, 95, pp. 735-758

Uchida, S., Chiba, R., Tomiha, M., Masaki, N., Shirai, M., (2003) Nanotechnol. Mesostruct. Mater. Stud. Surf. Sci. Catal, 146, pp. 799-802

Tanemura, S., Miao, L., Jin, P., Kaneko, K., Terai, A., Nabatova-Gabain, N., (2003) Appl. Surf. Sci, 212, pp. 654-660

Liqiang, J., Xiaojun, S., Baifu, X., Baiqi, W., Weimin, C., Honggang, F., (2004) J. Solid State Chem, 177, pp. 3375-3382

Yan, W., Chen, B., Mahurin, S.M., Hagaman, E.W., Dai, S., Overbury, S.H., (2004) J. Phys. Chem. B, 108, pp. 2793-2796

Busca, G., Ramis, G., Amores, J.M.G., Escribano, V.S., Piaggio, P., (1994) J. Chem. Soc. Faraday Trans, 90, pp. 3181-3190

Ding, X.Z., Liu, X.H., (1998) J. Mater. Res, 13, pp. 2556-2559

Powder Diffraction File Search Manual-Inorganic (1973), Published by the Joint Committee on Powder Diffractions Standards, (a) Card 21-1276

(b) Card 19-0869Spurr, R.A., Myers, H., (1957) Anal. Chem, 29, pp. 760-762

Cristallo, G., Roncari, E., Rinaldo, A., Trifiro, F., (2001) Appl. Catal. A, 209, pp. 249-256

Ousi-Benomar, W., Xue, S.S., Lessard, R.A., Singh, A., Wu, Z.L., Kuo, P.K., (1994) J. Mater. Res, 9, pp. 970-979

Goodhew, P.J., Humphreys, J., Beanland, R., Electron microscopy and analysis (2001), 3rd ed. Taylor & Francis: LondonWatteau, F., Villemin, G., (2001) Eur. J. Soil Sci, 52, pp. 385-396

Bersani, D., Lottici, P.P., Ding, X.Z., (1998) Appl. Phys. Lett, 72, pp. 73-75

Kelly, S., Pollak, F.H., Tomkiewicz, M., (1997) J. Phys. Chem. B, 101, pp. 2730-2734

Richter, H., Wang, Z.P., Ley, L., (1981) Solid State Commum, 39, pp. 625-629

Kumar, K.N.P., Keizer, K., Burggraaf, A., (1994) J. Mater. Sci. Lett, 13, pp. 59-61

Zhang, Y.H., Chan, C.K., Porter, J.F., Guo, W., (1998) J. Mater. Res, 13, pp. 2602-2609

Ohsaka, T., Izumi, F., Fujiki, Y., (1978) J. Raman Spectrosc, 7, pp. 321-324

Chun, H., Yizhong, W., Hongxiao, T., (2001) Appl. Catal. B, 30, pp. 277-285

Steele, B.C.H., (1984) Solid State Ionics, 12, pp. 391-406

McCarty, J.G., Wise, H., (1990) Catal. Today, 8, pp. 231-248

Mogensen, M., Sammes, N.M., Tompsett, G.A., (2000) Solid State Ionics, 129, pp. 63-94

Martinelli, G., Carrota, M.C., Ferroni, M., Sadaoka, Y., Traversa, E., (1999) Sens. Actuators B, 55, pp. 99-110

Chikyow, T., Bedair, S.M., Tye, L., El-Marsy, N.A., (1994) Appl. Phys. Lett, 65, pp. 1030-1032

Kim, C.G., (2001) Appl. Phys. Lett, 79, pp. 3047-3049

Morshed, A.H., Moussa, M.E., Bedair, S.M., Leonard, R., Liu, S.X., El-Masry, N., (1997) Appl. Phys. Lett, 70, pp. 1647-1649

Walkenhorst, A., Schimitt, M., Adrian, H., Petersen, K., (1994) Appl. Phys. Lett, 64, pp. 1871-1873

Zhang, F., Chan, S.W., Spanier, J.E., Apak, E., Jin, Q., Robinson, R.D., Herman, I.P., (2002) Appl. Phys. Lett, 80, pp. 127-129

Zhou, X.D., Huebner, W., Anderson, H.U., (2002) Appl. Phys. Lett, 80, pp. 3814-3816

Weber, W.H., Hass, K.C., McBride, J.R., (1993) Phys. Rev. B, 48, pp. 178-185

Spanier, J.E., Robinson, R.D., Zhang, F., Chan, S.W., Herman, I.P., (2001) Phys. Rev. B, 64, pp. 245407-245414

Tsunekawa, S., Fukuda, T., Kasuya, A., (2000) J. Appl. Phys, 87, pp. 1318-1321

Zhou, X.D., Huebner, W., (2001) Appl. Phys. Lett, 79, pp. 3512-3514

Powder Diffraction File Search Manual-Inorganic (1973) Published by the Joint Committee on Powder Diffractions Standards, , Card 34-0394

Keramidas, V.G., White, W.B., (1973) J. Chem. Phys, 59, pp. 1561-1562

Kosacki, I., Suzuki, T., Anderson, H.U., Colomban, P., (2002) Solid State Ionics, 149, pp. 99-105

Rekhi, S., Saxena, S.K., Lazor, P., (2001) J. Appl. Phys, 89, pp. 2968-2971

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