Erratum: Thermoelastic Analysis Of A Silicon Surface Under X-ray Free-electron-laser Irradiation (review Of Scientific Instruments (2010) 81 (073102))

dc.creatorDe Castro A.R.B.
dc.creatorVasconcellos A.R.
dc.creatorLuzzi R.
dc.date2011
dc.date2015-06-30T20:25:18Z
dc.date2015-11-26T14:49:14Z
dc.date2015-06-30T20:25:18Z
dc.date2015-11-26T14:49:14Z
dc.date.accessioned2018-03-28T22:00:11Z
dc.date.available2018-03-28T22:00:11Z
dc.identifier
dc.identifierReview Of Scientific Instruments. , v. 82, n. 4, p. - , 2011.
dc.identifier346748
dc.identifier10.1063/1.3575590
dc.identifierhttp://www.scopus.com/inward/record.url?eid=2-s2.0-79955638829&partnerID=40&md5=85ab68e8e8c5e59655a36b6b2345f9b7
dc.identifierhttp://www.repositorio.unicamp.br/handle/REPOSIP/107865
dc.identifierhttp://repositorio.unicamp.br/jspui/handle/REPOSIP/107865
dc.identifier2-s2.0-79955638829
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1253842
dc.description[No abstract available]
dc.description82
dc.description4
dc.description
dc.description
dc.languageen
dc.publisher
dc.relationReview of Scientific Instruments
dc.rightsaberto
dc.sourceScopus
dc.titleErratum: Thermoelastic Analysis Of A Silicon Surface Under X-ray Free-electron-laser Irradiation (review Of Scientific Instruments (2010) 81 (073102))
dc.typeErrata


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