| dc.creator | Lemos V. | |
| dc.creator | Vazquez-Lopez C. | |
| dc.creator | Cerdeira F. | |
| dc.date | 1993 | |
| dc.date | 2015-06-30T14:32:50Z | |
| dc.date | 2015-11-26T14:43:55Z | |
| dc.date | 2015-06-30T14:32:50Z | |
| dc.date | 2015-11-26T14:43:55Z | |
| dc.date.accessioned | 2018-03-28T21:52:22Z | |
| dc.date.available | 2018-03-28T21:52:22Z | |
| dc.identifier | | |
| dc.identifier | Superlattices And Microstructures. , v. 13, n. 2, p. 189 - , 1993. | |
| dc.identifier | 7496036 | |
| dc.identifier | 10.1006/spmi.1993.1036 | |
| dc.identifier | http://www.scopus.com/inward/record.url?eid=2-s2.0-44949266219&partnerID=40&md5=4b36c505eca312bc6f3a39150ef60770 | |
| dc.identifier | http://www.repositorio.unicamp.br/handle/REPOSIP/99792 | |
| dc.identifier | http://repositorio.unicamp.br/jspui/handle/REPOSIP/99792 | |
| dc.identifier | 2-s2.0-44949266219 | |
| dc.identifier.uri | http://repositorioslatinoamericanos.uchile.cl/handle/2250/1251895 | |
| dc.description | We performed a series of Raman and photoreflectance measurements on several InxGa1-xAs/GaAs strained layer superlattices of the same period but of different alloy compositions and substrate orientations. Both types of measurements are used in order to estimate the in-plane strain in these layers. The values obtained by both methods are in good mutual agreement, thus showing that photoreflectance is an effective method for strain determination. © 1993 Academic Press. All rights reserved. | |
| dc.description | 13 | |
| dc.description | 2 | |
| dc.description | 189 | |
| dc.description | | |
| dc.language | en | |
| dc.publisher | | |
| dc.relation | Superlattices and Microstructures | |
| dc.rights | fechado | |
| dc.source | Scopus | |
| dc.title | Strain Measurements In Inxga1-xas/gaas Strained-layer Superlattices By Photomodulated Reflectance | |
| dc.type | Artículos de revistas | |
