| dc.creator | Chang S.-L. | |
| dc.date | 1980 | |
| dc.date | 2015-06-30T13:45:05Z | |
| dc.date | 2015-11-26T14:40:18Z | |
| dc.date | 2015-06-30T13:45:05Z | |
| dc.date | 2015-11-26T14:40:18Z | |
| dc.date.accessioned | 2018-03-28T21:46:29Z | |
| dc.date.available | 2018-03-28T21:46:29Z | |
| dc.identifier | | |
| dc.identifier | Applied Physics Letters. , v. 37, n. 9, p. 819 - 821, 1980. | |
| dc.identifier | 36951 | |
| dc.identifier | 10.1063/1.92092 | |
| dc.identifier | http://www.scopus.com/inward/record.url?eid=2-s2.0-0141786365&partnerID=40&md5=a902428b313d5fbe8e0e6d358fea1542 | |
| dc.identifier | http://www.repositorio.unicamp.br/handle/REPOSIP/98910 | |
| dc.identifier | http://repositorio.unicamp.br/jspui/handle/REPOSIP/98910 | |
| dc.identifier | 2-s2.0-0141786365 | |
| dc.identifier.uri | http://repositorioslatinoamericanos.uchile.cl/handle/2250/1250354 | |
| dc.description | Because multiple simultaneous reflection of x rays is very sensitive to lattice deformation, the six-beam, (000) (006) (22̄4) (22̄2) (2̄24) (2̄22) multiple reflection was used to record simultaneously the information about the lattice mismatch of [001] InGaAsP materials using a divergent x-ray source. The lattice mismatches in directions parallel and perpendicular to [001], determined from a single divergent-beam photograph, increase as the As concentration in liquid composition Xl As increases. The procedure was used without difficulty for X l Ga as low as 0.0007 and Xl As in the range 0.006-0.01. | |
| dc.description | 37 | |
| dc.description | 9 | |
| dc.description | 819 | |
| dc.description | 821 | |
| dc.language | en | |
| dc.publisher | | |
| dc.relation | Applied Physics Letters | |
| dc.rights | aberto | |
| dc.source | Scopus | |
| dc.title | Determination Of The Three-dimensional Lattice Mismatch In Quaternary Iii-v Liquid Phase Epitaxial Layers Using Simultaneous Bragg Diffraction Of X-rays | |
| dc.type | Artículos de revistas | |
