Speckle Pattern Direct Photographic Correlation For Measuring Surface Roughness

dc.creatorSthel M.S.
dc.creatorLunazzi J.J.
dc.creatorHogert E.N.
dc.creatorGaggioli N.G.
dc.date1987
dc.date2015-06-30T13:41:23Z
dc.date2015-11-26T14:37:15Z
dc.date2015-06-30T13:41:23Z
dc.date2015-11-26T14:37:15Z
dc.date.accessioned2018-03-28T21:41:34Z
dc.date.available2018-03-28T21:41:34Z
dc.identifier
dc.identifierProceedings Of Spie - The International Society For Optical Engineering. Spie, v. 813, n. , p. 561 - 562, 1987.
dc.identifier0277786X
dc.identifier10.1117/12.967396
dc.identifierhttp://www.scopus.com/inward/record.url?eid=2-s2.0-0005024207&partnerID=40&md5=1fc4c445475ece07a482ecaeb531be50
dc.identifierhttp://www.repositorio.unicamp.br/handle/REPOSIP/98285
dc.identifierhttp://repositorio.unicamp.br/jspui/handle/REPOSIP/98285
dc.identifier2-s2.0-0005024207
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1249081
dc.descriptionCoordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)
dc.descriptionThe absolute measurement of the intensity correlation of a speckle pattern was previously demonstrated by using a photographic real-time technique (1). In this paper we demonstrate its use for the measurement of surface roughness in the 1-30,μm range, achieving many practical advantages over the two versions of a previous similar technique (2)(3).
dc.description813
dc.description
dc.description561
dc.description562
dc.descriptionCAPES; Coordenação de Aperfeiçoamento de Pessoal de Nível Superior; FAPERGS; Coordenação de Aperfeiçoamento de Pessoal de Nível Superior
dc.descriptionCoordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)
dc.languageen
dc.publisherSPIE
dc.relationProceedings of SPIE - The International Society for Optical Engineering
dc.rightsaberto
dc.sourceScopus
dc.titleSpeckle Pattern Direct Photographic Correlation For Measuring Surface Roughness
dc.typeActas de congresos


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