Time Resolved Chirp Measurements Of Fast Electro-optical Switches Based On Semiconductor Optical Amplifiers

dc.creatorMelnikoff N.
dc.creatorToazza A.L.
dc.creatorGallep C.M.
dc.creatorConforti E.
dc.date2007
dc.date2015-06-30T18:40:02Z
dc.date2015-11-26T14:31:12Z
dc.date2015-06-30T18:40:02Z
dc.date2015-11-26T14:31:12Z
dc.date.accessioned2018-03-28T21:34:34Z
dc.date.available2018-03-28T21:34:34Z
dc.identifier1424406617; 9781424406616
dc.identifierSbmo/ieee Mtt-s International Microwave And Optoelectronics Conference Proceedings. , v. , n. , p. 662 - 665, 2007.
dc.identifier
dc.identifier10.1109/IMOC.2007.4404349
dc.identifierhttp://www.scopus.com/inward/record.url?eid=2-s2.0-50449088030&partnerID=40&md5=564b568206d728f95ddda80a13b6b64f
dc.identifierhttp://www.repositorio.unicamp.br/handle/REPOSIP/104242
dc.identifierhttp://repositorio.unicamp.br/jspui/handle/REPOSIP/104242
dc.identifier2-s2.0-50449088030
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1247313
dc.descriptionA time resolved chirp measurement technique is introduced to measure optical carrier frequency fluctuations during the sub-nanosecond off-on and on-off transition of electro-optical switches based on semiconductor optical amplifiers. A periodic injected current signal was used for the switching action and a high performance optical bandpass filter for frequency discrimination. The results show a chirp peak of 3 GHz for injected current excursion of 80 mA. © 2007 IEEE.
dc.description
dc.description
dc.description662
dc.description665
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dc.languageen
dc.publisher
dc.relationSBMO/IEEE MTT-S International Microwave and Optoelectronics Conference Proceedings
dc.rightsfechado
dc.sourceScopus
dc.titleTime Resolved Chirp Measurements Of Fast Electro-optical Switches Based On Semiconductor Optical Amplifiers
dc.typeActas de congresos


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