dc.creatorCaetano, R. A.
dc.creatorSchulz, P. A.
dc.date2006-06-01
dc.date2014-07-17T17:28:05Z
dc.date2015-11-26T11:56:39Z
dc.date2014-07-17T17:28:05Z
dc.date2015-11-26T11:56:39Z
dc.date.accessioned2018-03-28T20:59:35Z
dc.date.available2018-03-28T20:59:35Z
dc.identifierBrazilian Journal of Physics. Sociedade Brasileira de Física, v. 36, n. 2a, p. 459-461, 2006.
dc.identifier0103-9733
dc.identifierS0103-97332006000300061
dc.identifier10.1590/S0103-97332006000300061
dc.identifierhttp://dx.doi.org/10.1590/S0103-97332006000300061
dc.identifierhttp://www.scielo.br/scielo.php?script=sci_arttext&pid=S0103-97332006000300061
dc.identifierhttp://www.repositorio.unicamp.br/jspui/handle/REPOSIP/25717
dc.identifierhttp://repositorio.unicamp.br/jspui/handle/REPOSIP/25717
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1238560
dc.descriptionRecent studies suggest that base pairing is an efficient electronic delocalization mechanism. However, defects may break down such effect. In the present work we show how a simple model of defects suppresses the delocalization, which survives only for low defect concentrations.
dc.description459
dc.description461
dc.languageen
dc.publisherSociedade Brasileira de Física
dc.relationBrazilian Journal of Physics
dc.rightsaberto
dc.sourceSciELO
dc.subjectDamaged DNA
dc.subjectDelocalization
dc.subjectTight binding model
dc.titleDelocalized states in damaged DNA
dc.typeArtículos de revistas


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