A study of the background radiation in inelastic X-ray scattering (IXS) and X-ray emission spectroscopy (XES) based on an analytical model is presented. The calculation model considers spurious radiation originated from ...

In this work, the design, fabrication, and evaluation of a compact, one-shot spectrometer based on a segmented conically bent crystal analyzer are described. The system is a “one-shot” wavelength dispersive spectrometer, ...