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Using shifts in the electronic emission curve to evaluate polymer surface degradation
(Elsevier B.V., 2001-01-01)
The polymer surface degradation and/or modification evolution of Teflon FEP and Mylar C films caused by a low energy electron beam were analyzed using a new method that consists in measuring the second crossover energy ...
Using shifts in the electronic emission curve to evaluate polymer surface degradation
(Elsevier B.V., 2001-01-01)
The polymer surface degradation and/or modification evolution of Teflon FEP and Mylar C films caused by a low energy electron beam were analyzed using a new method that consists in measuring the second crossover energy ...
Escape depth of secondary electrons from electron-irradiated polymers
(1992-08-01)
Measurements on polymers (Teflon FEP and Mylar) have shown that the secondary electron emission from uncharged surfaces exceeds that from surfaces containing a positive surface charge. The reduced emission of charged ...
Modelling polymers with side chains: MEH-PPV and P3HT
(2013-04-01)
Modelling polymers with side chains is always a challenge once the degrees of freedom are very high. In this study, we present a successful methodology to model poly[2-methoxy-5-(2′-ethyl-hexyloxy)-p-phenylenevinylene] ...
Modelling polymers with side chains: MEH-PPV and P3HT
(2013-04-01)
Modelling polymers with side chains is always a challenge once the degrees of freedom are very high. In this study, we present a successful methodology to model poly[2-methoxy-5-(2′-ethyl-hexyloxy)-p-phenylenevinylene] ...