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The kappa-mu Extreme Distribution
(Ieee-inst Electrical Electronics Engineers IncPiscatawayEUA, 2011)
Second-order statistics for diversity-combining, techniques in Nakagami-fading channels
(Institute of Electrical and Electronics Engineers (IEEE), 2001-11-01)
Exact and closed-form expressions for the level crossing rate and average fade duration are presented for the M branch pure selection combining (PSC), equal gain combining (EGC), and maximal ratio combining (MRC) techniques, ...
Second-order statistics for diversity-combining, techniques in Nakagami-fading channels
(Institute of Electrical and Electronics Engineers (IEEE), 2001-11-01)
Exact and closed-form expressions for the level crossing rate and average fade duration are presented for the M branch pure selection combining (PSC), equal gain combining (EGC), and maximal ratio combining (MRC) techniques, ...
Average channel capacity for generalized fading scenarios
(Ieee-inst Electrical Electronics Engineers IncPiscatawayEUA, 2007)
A simple accurate method for generating autocorrelated Nakagami-m envelope sequences
(Ieee-inst Electrical Electronics Engineers IncPiscatawayEUA, 2007)
On the Simulation and Correlation Properties of Phase-Envelope Nakagami Fading Processes
(Ieee-inst Electrical Electronics Engineers IncPiscatawayEUA, 2009)
Second-order statistics of eta-mu fading channels: Theory and applications
(Ieee-inst Electrical Electronics Engineers IncPiscatawayEUA, 2008)
General exact level crossing rate and average fade duration for dual-diversity combining of nonidentical correlated Weibull signals
(Ieee-inst Electrical Electronics Engineers IncPiscatawayEUA, 2007)
The RM2 Nakagami Fading Channel Simulator
(Ieee-inst Electrical Electronics Engineers IncPiscatawayEUA, 2013)