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Langmuir probe measurements in a time-fluctuating-highly ionized non-equilibrium cutting arc: analysis of the electron retarding part of the time-averaged current-voltage characteristic of the probe
(American Institute of Physics, 2013-12)
This work describes the application of Langmuir probe diagnostics to the measurement of the electron temperature in a time-fluctuating-highly ionized, non-equilibrium cutting arc. The electron retarding part of the ...
Standardless quantification methods in electron probe microanalysis
(Pergamon-Elsevier Science Ltd., 2014-11)
The elemental composition of a solid sample can be determined by electron probe microanalysis with or without the use of standards. The standardless algorithms are quite faster than the methods that require standards; they ...
Do the ball-ended probe cause less damage than sharp explorers?—An ultrastructural analysis
(BioMed Central, 2016)
Abstract
Background
No evidence about damage caused by ball-ended probes on tooth is available. No study compared probing defects caused by ball-ended probes with sharp ...
Evaluation and comparison of traditional methods and Electron Probe Micro Analysis (EPMA) to determine the chloride ingress perpendicular to cracks in self-healing concrete
(Elsevier, 2019-12)
The appearance of cracks in reinforced concrete structures accelerates the penetration of aggressive substances such as chloride ions into the concrete matrix. This leads to durability problems due to the accelerated onset ...
Acid-etching effects in hypomineralized amelogenesis imperfecta. A microscopic and microanalytical study
(Medicina Oral, Patología Oral y Cirugía Bucal, 2006)
Objectives: The purpose of this study was to use quantitative x-ray microprobe analysis with scanning electron microscopy to define the morphostructural and calcification patterns in the enamel of teeth with the hypomineralized ...
Separate K-line contributions to fluorescence enhancement in electron probe microanalysis
(Elsevier Science, 2013-01)
The behaviour of the fluorescence enhancement correction factor in electron probe microanalysis, as a function of incident electron energy and take-off angle, is assessed for different binary samples in a wide range of ...