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Mylar Secondary Emission-energy Distribution and Yields
(Institute of Electrical and Electronics Engineers (IEEE), 2014-02-01)
We have characterized Mylar by determining the emission yield and energy spectrum of emitted secondary electrons. In this study we used a conventional electron accelerator apparatus to which we have made some important ...
Electron field emission from boron doped microcrystalline diamond
(Elsevier B.V., 2007-07-15)
Field emission properties of hot filament chemical vapor deposited boron doped polycrystalline diamond have been studied. Doping level (N-B) of different samples has been varied by the B/C concentration in the gas feed ...
Electron field emission from boron doped microcrystalline diamond
(Elsevier B.V., 2007-07-15)
Field emission properties of hot filament chemical vapor deposited boron doped polycrystalline diamond have been studied. Doping level (N-B) of different samples has been varied by the B/C concentration in the gas feed ...
Escape depth of secondary electrons from electron-irradiated polymers
(1992-08-01)
Measurements on polymers (Teflon FEP and Mylar) have shown that the secondary electron emission from uncharged surfaces exceeds that from surfaces containing a positive surface charge. The reduced emission of charged ...
Mylar Secondary Emission-energy Distribution and Yields
(Institute of Electrical and Electronics Engineers (IEEE), 2014)
Mylar Secondary Emission-energy Distribution and Yields
(Institute of Electrical and Electronics Engineers (IEEE), 2014)
Identification of mechanisms of ion induced electron emission by factor analysis
(Elsevier Science, 2005-04)
Introducing the use of the Factor Analysis method to analyze electron emission spectra we identify different mechanisms for electron emission from clean Al surfaces under bombardment by Ar+ and Li+ ions. The analysis of ...
Energy Distribution of Secondary Electrons from Gold on Teflon-FEP
(Ieee-inst Electrical Electronics Engineers Inc, 2016-10-01)
This paper presents results of the spectrum of energy of secondary electrons for the energies of perpendicularly incident electrons of 0.4 keV, 2.0 keV, or 3.5 keV in a gold surface deposited on a substratum of Teflon-FEP. ...