Buscar
Mostrando ítems 1-10 de 481
Threshold voltages of SOI MuGFETs
(PERGAMON-ELSEVIER SCIENCE LTD, 2008)
The multiple-gate field-effect transistor (MuGFET) is a device with a gate folded on different sides of the channel region. They are one of the most promising technological solutions to create high-performance ultra-scaled ...
Direct determination of threshold condition in DG-MOSFETs from the gm/ID curve
(2011)
In this work we apply the current-based threshold voltage definition (equality between the drift and diffusion components of drain current) to intrinsic symmetric double-gate MOSFETs. We show that the half
maximum point ...
Ground plane impact on the threshold voltage of relaxed ge pfinfets
(2018-10-26)
In this paper the Ground Plane (GP) influence on the threshold voltage of Ge pFinFET devices is investigated. In order to explain the experimental threshold voltage variation with fin width, TCAD simulations have been ...
Exploring the voltage divider approach for accurate memristor state tuning
(IEEE, 2017)
The maximum exploitation of the favorable properties and the analog nature of memristor technology in future nonvolatile resistive memories, requires accurate multi-level programming. In this direction, we explore the ...
Threshold voltage in junctionless nanowire transistors
(2011)
This work presents a physically based analytical model for the threshold voltage in junctionless nanowire transistors (JNTs). The model is based on the solution of the two-dimensional Poisson equation and includes the ...
Threshold voltage in junctionless nanowire transistors
(2011)
This work presents a physically based analytical model for the threshold voltage in junctionless nanowire transistors (JNTs). The model is based on the solution of the two-dimensional Poisson equation and includes the ...
Analysis of temperature-induced saturation threshold voltage degradation in deep-submicrometer ultrathin SOI MOSFETs
(2005)
This paper presents a systematic study of the temperature lowering influence on the saturation threshold voltage degradation in ultrathin deep-submicrometer fully depleted silicon-on-insulator (SOI) MOSFETs. It is observed ...
Analysis of threshold voltage fluctuations due to short channel and random doping effects
(Superficies y Vacío, 2013)