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A polaronic stacking fault defect model for CaCu3Ti4O12 material: an approach for the origin of the huge dielectric constant and semiconducting coexistent features
(Iop Publishing Ltd, 2009-03-07)
This paper proposes a polaronic stacking fault defect model as the origin of the huge dielectric properties in CaCu3Ti4O12 (CCTO) materials. The model reconciles the opposing views of researchers on both sides of the ...
A polaronic stacking fault defect model for CaCu3Ti4O12 material: an approach for the origin of the huge dielectric constant and semiconducting coexistent features
(Iop Publishing Ltd, 2009-03-07)
This paper proposes a polaronic stacking fault defect model as the origin of the huge dielectric properties in CaCu3Ti4O12 (CCTO) materials. The model reconciles the opposing views of researchers on both sides of the ...
Nonphysical thermodynamical phases in L1(2) intermetallic alloys from semiempirical tight-binding potentials
(Elsevier Science BvAmsterdamHolanda, 2008)
Point defect interactions with extended defects in semiconductors
(American Physical SocCollege PkEUA, 1999)
Experimental determination of the driving force of the fcc-hcp martensitic transformation and the stacking fault energy in high-Mn Fe-Mn-Cr steels
(Elsevier Science SA, 2019-08-15)
By the use of several experimental techniques the difference in the Gibbs free energy between fcc austenite and hcp martensite has been determined for a wide range of compositions of Fe-Mn-Cr alloys where the martensitic ...
Nanoscale effects and polaronic relaxation in CaCu3Ti 4O12 compounds
(2011-01-01)
In the present communication, by using dielectric spectroscopy measurement, the correlations between Nanosized Barrier Layer Capacitance (NBLC) (Bueno et al. (2009) [7]) and the high frequency polaronic near-Debye dipolar ...
Nanoscale effects and polaronic relaxation in CaCu3Ti 4O12 compounds
(2011-01-01)
In the present communication, by using dielectric spectroscopy measurement, the correlations between Nanosized Barrier Layer Capacitance (NBLC) (Bueno et al. (2009) [7]) and the high frequency polaronic near-Debye dipolar ...
Kinetic Effects in InP Nanowire Growth and Stacking Fault Formation: The Role of Interface Roughening
(Amer Chemical SocWashingtonEUA, 2011)