Buscar
Mostrando ítems 1-10 de 142
Fabrication of sharp silicon tips employing anisotropic wet etching and reactive ion etching
(Elsevier Sci LtdOxfordInglaterra, 2005)
Fabrication and electrical performance of high-density arrays of nanometric silicon tips
(Elsevier Science BvAmsterdamHolanda, 2010)
Current-voltage characterization and temporal stability of the emission current of silicon tip arrays
(Elsevier Science BvAmsterdamHolanda, 2004)
Dielectric exchange: The key repulsive or attractive transient forces between atomic force microscope tips and charged surfaces
(Amer Inst PhysicsWoodburyEUA, 1999)
Rupture force of adsorbed self-assembled surfactant layers - Effect of the dielectric exchange force
(Elsevier Science BvAmsterdamHolanda, 2001)
Imaging of soft structures: Dependence of contrast in atomic force microscopy images on the force applied by the tip
(Amer Inst PhysicsMelvilleEUA, 2000)
Fabrication of silicon field-emission arrays using masks of amorphous hydrogenated carbon films
(Elsevier Sci LtdOxfordInglaterra, 2007)
Electrostatic response of hydrophobic surface measured by atomic force microscopy
(Amer Inst PhysicsMelvilleEUA, 2003)