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A modification of close-space vapor transport combined with free evaporation technique for doping semiconductor films and production of interfaces
(Sociedad Mexicana de Fisica, 2013-01-16)
Density of States of a Nanoscale Semiconductor Interface as a Transduction Signal for Sensing Molecules
(2021-08-24)
Nanoscale inorganic semiconductors (with interfacial thickness <10 nm) have superior stability compared to soft organic compounds and are important for the development of enhanced reagentless sensing devices. As a proof ...
X ray photoelectron analysis of oxide-semiconductor interface after breakdown in Al2O3/InGaAs stacks
(American Institute of Physics, 2014-08)
In this work, the post-breakdown characteristics of metal gate/Al2O3/InGaAs structures were studied using surface analysis by x ray photoelectron spectroscopy. The results show that for dielectric breakdown under positive ...
Interface roughness in short-period InGaAs/InP superlattices
(AMER INST PHYSICS, 2008)
Electron mobility was studied in lattice-matched short-period InGaAs/InP superlattices as a function of the width of the wells. The decreasing mobility with decreasing well width was shown to occur due to the interface ...
Transporte electrónico en silicio poroso nanoestructurado
(2013-03-25)
En este trabajo se fabricaron dispositivos basados en silicio poroso nanoestructurado, con el fin de estudiar y caracterizar sus propiedades de transporte eléctrico, buscando acumular datos que permitan en un futuro ...
Separating interface state response from parasitic effects in conductance measurements on organic metal-insulator-semiconductor capacitors
(American Institute of Physics (AIP), 2008-03-01)
A simple model is developed for the admittance of a metal-insulator-semiconductor (MIS) capacitor which includes the effect of a guard ring surrounding the Ohmic contact to the semiconductor. The model predicts most of the ...
Influence of the oxide–semiconductor interface on the resistive switching phenomenon in metal/Al2O3/InGaAs
(Elsevier, 2014-01)
In this work, the influence of the oxide–semiconductor interface on the resistive switching phenomenon was studied in metal gates /Al2O3/InGaAs structures. Different sets of samples were manufactured to produce different ...
Intergranular barrier height fluctuations in polycrystalline semiconductors
(Wiley-VCH, 2017-05)
The punctual character and random nature of the impurity positions in depletion regions lead to inhomogeneities that can significantly affect the potential intergranular barriers at polycrystalline semiconductors and, in ...
Separating interface state response from parasitic effects in conductance measurements on organic metal-insulator-semiconductor capacitors
(American Institute of Physics (AIP), 2014)