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X-ray multiple diffraction in Renninger scanning mode: Simulation of data recorded using synchrotron radiation
(Munksgaard Int Publ LtdCopenhagenDinamarca, 1996)
An instrument for combining x-ray multiple diffraction and x-ray topographic imaging for examining crystal microcrystallography and perfection
(Amer Inst PhysicsMelvilleEUA, 2009)