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Localized corrosion evaluation of the ASTM F139 stainless steel marked by laser using scanning vibrating electrode technique, X-ray photoelectron spectroscopy and Mott-Schottky techniques

PIERETTI, EURICO F.; MANHABOSCO, SARA M.; DICK, LUIS F.P.; HINDER, STEVE; COSTA, ISOLDA (2014)

Polymer treatment by plasma immersion ion implantation of nitrogen for formation of diamond-like carbon film

Tan, Ing Hwie; Ueda, Mario; Kostov, Konstantin; Nascente, Pedro Augusto P.; Demarquette, Nicole Raymonde (2014)

Polymer treatment by plasma immersion ion implantation of nitrogen for formation of diamond-like carbon film

Lab. Associado de Plasmas; Universidade Federal de São Carlos (UFSCar); Universidade de São Paulo (USP); Universidade Estadual Paulista (Unesp) (2004-09-01)

Nitrogen ions were implanted by plasma immersion in Kapton, Mylar and polypropylene, with the objective of forming a diamond-like carbon layer on these polymers. The Raman spectrum of the implanted polypropylene showed ...

Polymer treatment by plasma immersion ion implantation of nitrogen for formation of diamond-like carbon film

Lab. Associado de Plasmas; Universidade Federal de São Carlos (UFSCar); Universidade de São Paulo (USP); Universidade Estadual Paulista (Unesp) (2004-09-01)

Corrosion protection of fluorzirconate glasses coated by a layer of surface modified tin oxide nanoparticles

Universidade Estadual Paulista (Unesp); Universidade Estadual de Campinas (UNICAMP) (2006-04-28)

The protection efficiency against water corrosion of fluorozirconate glass, ZBLAN, dip-coated by nanocrystalline tin oxide film containing the organic molecule Tiron® was investigated by X-ray photoelectron spectroscopy ...

Corrosion protection of fluorzirconate glasses coated by a layer of surface modified tin oxide nanoparticles

Universidade Estadual Paulista (Unesp); Universidade Estadual de Campinas (UNICAMP) (2006-04-28)

Morphological and magnetic properties of carbon-nickel nanocomposite thin films

FONSECA, F.C.; FERLAUTO, A.S.; ALVAREZ, F.; GOYA, G.F.; JARDIM, R.F. (2005)

Electronic structure determination using an assembly of conventional and synchrotron techniques : The case of a xanthate complex

Juncal, Luciana Celeste; Avila, José; Asensio, Maria Carmen; Della Védova, Carlos Omar; Romano, Rosana Mariel (2017)

Corrosion protection of fluorzirconate glasses coated by a layer of surface modified tin oxide nanoparticles

Hammer, Peter; Rizzato, A. P.; Alvarez, F.; Landers, R.; Pulcinelli, Sandra Helena; Santilli, Celso Valentim (2014)

Probing the Roughness of Porphyrin Thin Films with X-ray Photoelectron Spectroscopy

Kataev, Elmar; Wechsler, Daniel; Williams, Federico José; Köbl, Julia; Tsud, Natalia; Franchi, Stefano; Steinruck, Hans Peter; Lytken, Ole (Wiley VCH Verlag, 2020-10)

Thin-film growth of molecular systems is of interest for many applications, such as for instance organic electronics. In this study, we demonstrate how X-ray photoelectron spectroscopy (XPS) can be used to study the growth ...

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Localized corrosion evaluation of the ASTM F139 stainless steel marked by laser using scanning vibrating electrode technique, X-ray photoelectron spectroscopy and Mott-Schottky techniques

Polymer treatment by plasma immersion ion implantation of nitrogen for formation of diamond-like carbon film

Polymer treatment by plasma immersion ion implantation of nitrogen for formation of diamond-like carbon film

Polymer treatment by plasma immersion ion implantation of nitrogen for formation of diamond-like carbon film

Corrosion protection of fluorzirconate glasses coated by a layer of surface modified tin oxide nanoparticles

Corrosion protection of fluorzirconate glasses coated by a layer of surface modified tin oxide nanoparticles

Morphological and magnetic properties of carbon-nickel nanocomposite thin films

Electronic structure determination using an assembly of conventional and synchrotron techniques : The case of a xanthate complex

Corrosion protection of fluorzirconate glasses coated by a layer of surface modified tin oxide nanoparticles

Probing the Roughness of Porphyrin Thin Films with X-ray Photoelectron Spectroscopy