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LFSR characteristic polynomial and phase shifter computation for two-dimensional test set generation
(Institute of Electrical and Electronics Engineers Inc., 2017)
In built-in two-dimensional deterministic test pattern generation, a Linear Feedback Shift Register (LFSR) extended by phase shifters (PS) is commonly used for generating the test patterns. The specific LFSR/PS structure ...
Modelo optimizado del codificador Reed-Solomon (255,k) en VHDL a través de un LFSR paralelizado
(2013-03)
En esta investigación se presenta un modelo eficiente de codificador Reed Solomon RS(n,k), para su descripción usando VHDL (VHSIC hardware description language), bajo la filosofía de sistemas reconfigurables. El principal ...
Test Modules Design for a SerDes Chip in 130 nm CMOS technology
(ITESO, 2016-07)
Test Modules Design for a SerDes Chip in 130 nm CMOS technology
(ITESO, 2016-07)