The methodology for fracture analysis of polymeric composites with scanning electron microscopes (SEM) is still under discussion. Many authors prefer to use sputter coating with a conductive material instead of applying ...

The methodology for fracture analysis of polymeric composites with scanning electron microscopes (SEM) is still under discussion. Many authors prefer to use sputter coating with a conductive material instead of applying ...

The electrostatic self-force on a point charge in cylindrical thin-shell space-times is interpreted as the sum of a bulk field and a shell field. The bulk part corresponds to a field sourced by the test charge placed in a ...

In the present paper, we discuss a generalized theory of electrical characteristics for amorphous semiconductor (or insulator) Schottky barriers, considering: (i) surface states, (ii) doping impurity states at a single ...

In the present paper, we discuss a generalized theory of electrical characteristics for amorphous semiconductor (or insulator) Schottky barriers, considering: (i) surface states, (ii) doping impurity states at a single ...

In Contact Mode Atomic Force Microscopy (CM-AFM), a cantilever with a sharp tip on its end is employed to acquire topographic information. Such acquisition is normally made by monitoring the deflection of the cantilever ...