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A note on buckling and vibration of clamped orthotopic plates under in-plane loads
(Techno-Press, 2011-07)
The present work deals with obtaining the critical buckling load and the natural frequencies of clamped, orthotropic, rectangular thin plates subjected to different linear distributed in-plane forces. An analytical solution ...
Coupling between Transverse Vibrations and Instability Phenomena of Plates Subjected to In-Plane Loading
(Hindawi Publishing Corporation, 2013-01)
As it is known, the problems of free transverse vibrations and instability under in-plane loads of a plate are two different technological situations that have similarities in their approach to elastic solution. In fact, ...
Probing the ladder spectrum arising from motion in a two-dimensional lattice driven by in-plane constant forces
(AMERICAN PHYSICAL SOCIETY, 2004)
Fatigue apparatus for geometrically complex non-standardized specimens
(2009-01-01)
Standard Test Methods (e.g. ASTM, DIN) for materials characterization in general, and for fatigue in particular, do not contemplate specimens with complex geometries, as well as the combination of axial and in-plane bending ...
Fatigue apparatus for geometrically complex non-standardized specimens
(2009-01-01)
Standard Test Methods (e.g. ASTM, DIN) for materials characterization in general, and for fatigue in particular, do not contemplate specimens with complex geometries, as well as the combination of axial and in-plane bending ...
Cyclic behavior of wood-frame shear walls with vertical load and bending moment for mid-rise timber buildings
(2021)
In light wood-frame buildings, the gravitational and lateral force-resisting systems are composed of floor diaphragms and shear walls. During an earthquake, these walls are subjected to the simultaneous action of in-plane ...
Vertical and in-plane electrical transport in InAs/InP semiconductor nanostructures
(2005-06-20)
Vertical and in-plane electrical transport in InAs/InP semiconductors wires and dots have been investigated by conductive atomic force microscopy (C-AFM) and electrical measurements in processed devices. Localized I-V ...
Vertical and in-plane electrical transport in InAs/InP semiconductor nanostructures
(2005-06-20)
Vertical and in-plane electrical transport in InAs/InP semiconductors wires and dots have been investigated by conductive atomic force microscopy (C-AFM) and electrical measurements in processed devices. Localized I-V ...