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Thickness dependence of structure and piezoelectric properties at nanoscale of polycrystalline lead zirconate titanate thin films
(2013-05-14)
Lead zirconate titanate Pb(Zr0.50Ti0.50)O3 (PZT) thin films were deposited by a polymeric chemical method on Pt(111)/Ti/SiO2/Si substrates to understand the mechanisms of phase transformations and the effect of film thickness ...
Thickness dependence of structure and piezoelectric properties at nanoscale of polycrystalline lead zirconate titanate thin films
(2013-05-14)
Lead zirconate titanate Pb(Zr0.50Ti0.50)O3 (PZT) thin films were deposited by a polymeric chemical method on Pt(111)/Ti/SiO2/Si substrates to understand the mechanisms of phase transformations and the effect of film thickness ...
Boundary Tension at the Interface of Nanoscopic Helium Films on an Heterogeneous Substrate
(Springer, 2014-07)
This paper reports the first calculation of the two-dimensional interfacial profile and energetics of nanoscopically thin films of helium, on an heterogeneous planar substrate consisting of two adjoining metals. The ...
Nanohardness of a Ti thin film and its interface deposited by an electron beam on a 304 SS substrate
(Wiley-Blackwell, 2002-07-01)
The results of nanohardness measurements at a film surface and film-substrate interface are presented and discussed. An electron beam device was used to deposit a Ti film on a 304 stainless steel (304 SS) substrate. The ...
Nanohardness of a Ti thin film and its interface deposited by an electron beam on a 304 SS substrate
(2002-08-15)
The results of nanohardness measurements at a film surface and film-substrate interface are presented and discussed. An electron beam device was used to deposit a Ti film on a 304 stainless steel (304 SS) substrate. The ...
Nanohardness of a Ti thin film and its interface deposited by an electron beam on a 304 SS substrate
(Wiley-Blackwell, 2002-07-01)
The results of nanohardness measurements at a film surface and film-substrate interface are presented and discussed. An electron beam device was used to deposit a Ti film on a 304 stainless steel (304 SS) substrate. The ...
Thickness dependence of structure and piezoelectric properties at nanoscale of polycrystalline PZT thin films
(2012-10-31)
Lead zirconate titanate Pb(Zr 0.50Ti 0.50)O 3 (PZT) thin films were deposited by a polymeric chemical method on Pt(111)/Ti/SiO2/Si substrates to understand the mechanisms of phase transformations and the effect of film ...
Thickness dependence of structure and piezoelectric properties at nanoscale of polycrystalline PZT thin films
(2012-10-31)
Lead zirconate titanate Pb(Zr 0.50Ti 0.50)O 3 (PZT) thin films were deposited by a polymeric chemical method on Pt(111)/Ti/SiO2/Si substrates to understand the mechanisms of phase transformations and the effect of film ...
Low interface states and high dielectric constant Y2O3 films on Si substrates
(American Vacuum Society, 2013-01-16)