Buscar
Mostrando ítems 1-10 de 534
Coloring ionic trapping states in WO3 and Nb2O5 electrochromic materials
(Pergamon-Elsevier B.V. Ltd, 2008-07-01)
Complex electro-optical analysis is a very useful approach to separate different kinetic processes that occur during ionic insertion reactions in electrochromic oxide materials. In this paper, we use this type of combined ...
Coloring ionic trapping states in WO3 and Nb2O5 electrochromic materials
(Pergamon-Elsevier B.V. Ltd, 2008-07-01)
Complex electro-optical analysis is a very useful approach to separate different kinetic processes that occur during ionic insertion reactions in electrochromic oxide materials. In this paper, we use this type of combined ...
Magnetic field release of trapped charges in poly(fluorenylenevinylene)s
(Elsevier B.V., 2007-12-01)
We have measured the effect of an applied magnetic field on the current through thin films of two different organic conjugated polymers that have previously shown to exhibit magnetoresistance, poly(9,9-dioctyl-1,4-fluore ...
Coloring ionic trapping states in WO3 and Nb2O5 electrochromic materials
(Pergamon-Elsevier B.V. Ltd, 2014)
The impact of spacer oxide material on the underlapped soi-nfinfet working as charged based radiation sensor
(2021-08-23)
— In this work, the influence of the underlap region on the electrical behavior of a SOI-nFinFET transistor has been studied by numerical simulation with the purpose of radiation sensing. The analysis has been performed ...
Trap-Door-Like irreversible photoinduced charge transfer in a Donor-Acceptor Complex
(American Chemical Society, 2018-06)
For efficient conversion of light into useful energy sources, it is very important to study and describe the first steps of primary charge-transfer process in natural structures and artificial devices. The time scale of ...
HfO₂ nanoparticles embedded within a SOG-based oxide matrix as charge trapping layer for SOHOS-type memory applications
(Journal of Non-Crystalline Solids, 2012)
Charge trapping and de-trapping in Si-nanoparticles embedded in silicon oxide films
(WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim, 2008)
Charge trapping and de-trapping in Si-nanoparticles embedded in silicon oxide films
(WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim, 2008)