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Microstructure, dielectric properties and optical band gap control on the photoluminescence behavior of Ba[Zr0.25Ti0.75]O-3 thin films
(Springer, 2009-01-01)
Ba[Zr0.25Ti0.75]O-3 (BZT) thin films were synthesized by the complex polymerization method and heat treated at 400 A degrees C for different times and at 700 A degrees C for 2 h. These thin films were analyzed by X-ray ...
Microstructure, dielectric properties and optical band gap control on the photoluminescence behavior of Ba[Zr0.25Ti0.75]O-3 thin films
(Springer, 2009-01-01)
Ba[Zr0.25Ti0.75]O-3 (BZT) thin films were synthesized by the complex polymerization method and heat treated at 400 A degrees C for different times and at 700 A degrees C for 2 h. These thin films were analyzed by X-ray ...
Temperature dependence of dielectric properties for Ba(Zr0.25Ti0.75)O-3 thin films obtained from the soft chemical method
(Elsevier B.V., 2007-10-15)
Ba(Zr0.25Ti0.75)O-3(BZT) thin films prepared by the polymeric precursor method (PPM) were annealed at 500, 600, and 700 degrees C for 4h. All films crystallized in the perovskite structure present a crack-free microstructure. ...
Temperature dependence of dielectric properties for Ba(Zr0.25Ti0.75)O-3 thin films obtained from the soft chemical method
(Elsevier B.V., 2007-10-15)
Ba(Zr0.25Ti0.75)O-3(BZT) thin films prepared by the polymeric precursor method (PPM) were annealed at 500, 600, and 700 degrees C for 4h. All films crystallized in the perovskite structure present a crack-free microstructure. ...
Microstructure, dielectric properties and optical band gap control on the photoluminescence behavior of Ba['Zr IND.0.25''Ti IND. 0.75]'O IND.3' thin films
(SpringerDordrecht, 2009-01)
Ba[Zr0.25Ti0.75]O3 (BZT) thin films were synthesized
by the complex polymerization method and heat
treated at 400 C for different times and at 700 C for 2 h.
These thin films were analyzed by X-ray diffraction
(XRD), ...
Effect of annealing time on morphological characteristics of Ba(Zr,Ti)O-3 thin films
(Elsevier B.V., 2007-06-28)
Ba(Zr0.50Ti0.50)O-3 thin films were prepared by the polymeric precursor method using the annealing low temperature of 300 degrees C for 8, 16, 24, 48, 96 and 192 It in a furnace tube with oxygen atmosphere. The X-ray ...
Effect of annealing time on morphological characteristics of Ba(Zr,Ti)O-3 thin films
(Elsevier B.V., 2007-06-28)
Ba(Zr0.50Ti0.50)O-3 thin films were prepared by the polymeric precursor method using the annealing low temperature of 300 degrees C for 8, 16, 24, 48, 96 and 192 It in a furnace tube with oxygen atmosphere. The X-ray ...
Characterization of BaTi1-xZrxO3 thin films obtained by a soft chemical spin-coating technique
(American Institute of Physics (AIP), 2004-10-15)
Single-phase perovskite structure BaZrxTi1-xO3 (BZT) (0.05less than or equal toxless than or equal to0.25) thin films were deposited on Pt-Ti-SiO2-Si substrates by the spin-coating technique. The structural modifications ...
Characterization of BaTi1-xZrxO3 thin films obtained by a soft chemical spin-coating technique
(American Institute of Physics (AIP), 2004-10-15)
Single-phase perovskite structure BaZrxTi1-xO3 (BZT) (0.05less than or equal toxless than or equal to0.25) thin films were deposited on Pt-Ti-SiO2-Si substrates by the spin-coating technique. The structural modifications ...