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Nanohardness of a Ti thin film and its interface deposited by an electron beam on a 304 SS substrate
(2002-08-15)
The results of nanohardness measurements at a film surface and film-substrate interface are presented and discussed. An electron beam device was used to deposit a Ti film on a 304 stainless steel (304 SS) substrate. The ...
Nanohardness of a Ti thin film and its interface deposited by an electron beam on a 304 SS substrate
(Wiley-Blackwell, 2002-07-01)
The results of nanohardness measurements at a film surface and film-substrate interface are presented and discussed. An electron beam device was used to deposit a Ti film on a 304 stainless steel (304 SS) substrate. The ...