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Dielectric Constant Measurements Using an Open-Ended Coaxial Probe and a Vector Network Analyzer -Edición Única
(Instituto Tecnológico y de Estudios Superiores de Monterrey, 2015)
Low interface states and high dielectric constant Y2O3 films on Si substrates
(American Vacuum Society, 2013-01-16)
Low interface states and high dielectric constant Y2O3 films on Si substrates
(American Vacuum Society, 2013-01-16)
Microstructure, dielectric properties and optical band gap control on the photoluminescence behavior of Ba[Zr0.25Ti0.75]O-3 thin films
(Springer, 2009-01-01)
Ba[Zr0.25Ti0.75]O-3 (BZT) thin films were synthesized by the complex polymerization method and heat treated at 400 A degrees C for different times and at 700 A degrees C for 2 h. These thin films were analyzed by X-ray ...
Dielectric properties of Na1-xLixNbO3 ceramics from powders obtained by chemical synthesis
(Elsevier B.V., 1999-01-01)
Ultra-fine powders of Na1-xLixNbO3 (x=0; 0.06; 0.09; 0.12) were synthesized by the Polymeric Precursors Method. Such powders had their orthorhombic structures determined by X-ray diffraction and their surface area determined ...