Buscar
Mostrando ítems 21-30 de 10341
Background radiation in inelastic X-ray scattering and X-ray emission spectroscopy. A study for Johann-type spectrometers
(Elsevier Science, 2018-06-21)
A study of the background radiation in inelastic X-ray scattering (IXS) and X-ray emission spectroscopy (XES) based on an analytical model is presented. The calculation model considers spurious radiation originated from ...
Methanol oxidation on PtRu/C electrocatalysts prepared by a microemulsion method
(2007-12-01)
PtRu/C nanocatalysts were prepared by a microemulsion method using different values of water/surfactant molar ratio in order to get different particle sizes. Crystallite sizes and structural properties were determined by ...
X-ray phase measurements as a probe of small structural changes in doped nonlinear optical crystals
(WILEY-BLACKWELL, 2011)
X-ray multiple diffraction experiments with synchrotron radiation were carried out on pure and doped nonlinear optical crystals: NH(4)H(2)PO(4) and KH(2)PO(4) doped with Ni and Mn, respectively. Variations in the intensity ...
Study of error analysis and sources of uncertainty in the measurement of residual stresses by the X-Ray diffractionResidual Stresses
(Materials Research Forum LLC, 2018)
Construction and test of low cost X-ray tomography scanner for physical-chemical analysis and nondestructive inspections
(2009-11-27)
X-ray computed tomography (CT) refers to the cross-sectional imaging of an object measuring the transmitted radiation at different directions. In this work, we describe the development of a low cost micro-CT X-ray scanner ...
Construction and test of low cost X-ray tomography scanner for physical-chemical analysis and nondestructive inspections
(2009-11-27)
X-ray computed tomography (CT) refers to the cross-sectional imaging of an object measuring the transmitted radiation at different directions. In this work, we describe the development of a low cost micro-CT X-ray scanner ...
Construction and Test of Low Cost X-Ray Tomography Scanner for Physical-Chemical Analysis and Nondestructive Inspections
(Amer Inst Physics, 2009-01-01)
X-ray computed tomography (CT) refers to the cross-sectional imaging of an object measuring the transmitted radiation at different directions. In this work, we describe the development of a low cost micro-CT X-ray scanner ...