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Desarrollo de un sistema de medición de ruido de baja frecuencia para caracterización de canales conductivos en dispositivos electrónicos.
(Escuela Superior Politécnica de Chimborazo, 2019-11-29)
A low frequency electronic noise measurement system was developed for the characterization of conductive channels in electronic devices. As part of the methodology, the design steps of the system are described starting ...
Estudio del efecto de estrés térmico y eléctrico en dispositivos electrónicos a través de mediciones de ruido de baja frecuencia.
(Escuela Superior Politécnica de Chimborazo, 2020-09-21)
In this degree work, the effect of thermal and electrical stress on power semiconductor devices was studied through low-frequency noise measurements. As part of the methodology, the experimental design steps are described ...