Artículos de revistas
Diffusion of Sn in different purity α-Ti
Fecha
2003-05Registro en:
Perez, Rodolfo Ariel; Dyment, Fanny; Behar, Andrea Marcela; Diffusion of Sn in different purity α-Ti; Elsevier Science; Materials Letters; 57; 18; 5-2003; 2670-2674
0167-577X
CONICET Digital
CONICET
Autor
Perez, Rodolfo Ariel
Dyment, Fanny
Behar, Andrea Marcela
Resumen
The diffusion of Sn in the hcp (α) phase of high purity (99.99%) and pure (99.9%) Ti was studied at different temperatures from 873 up to 1100 K. The Rutherford Backscattering Spectrometry (RBS) technique was used to obtain the penetration profiles. The evolution of the diffusion coefficient, D, as a function of temperature follows the prediction of the Arrhenius law. No significant difference between both kinds of Ti samples was observed. Normal diffusion parameters, Q and D0, close to the self-diffusion ones were obtained.