Artículos de revistas
An instrument for combining x-ray multiple diffraction and x-ray topographic imaging for examining crystal microcrystallography and perfection
Registration in:
Review Of Scientific Instruments. Amer Inst Physics, v. 80, n. 3, 2009.
0034-6748
WOS:000264776600025
10.1063/1.3103571
Author
Lai, X
Ma, CY
Roberts, KJ
Cardoso, LP
dos Santos, AO
Bogg, D
Miller, MC
Institutions
Abstract
Diffraction imaging using x-ray topography (XRT) and x-ray multiple diffraction (XRMD) provide valuable tools for examining the growth defects in crystals and the distributions from ideal lattice symmetry (microcrystallography). The topographic x-ray multiple diffraction microprobe (TMDM) combines the complementary aspects of both techniques enabling XRT and XRMD studies within the same instrument providing a useful resource for the structural characterization of materials that are not very stable in vacuum and electron beam environments. The design of the TMDM instrument is described together with data taken on GaAs (001) and potassium dihydrogen phosphate (001). 80 3 EPSRC, U.K. [GR/R/65787/01] EPSRC, U.K. [GR/R/65787/01]
Subjects
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